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GB/T 33834-2017 English PDF

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GB/T 33834-2017: Microbeam analysis -- Scanning electron microscopy -- Scanning electron microscope analysis of biological specimens
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GB/T 33834-2017English239 Add to Cart 3 days [Need to translate] Microbeam analysis -- Scanning electron microscopy -- Scanning electron microscope analysis of biological specimens Valid GB/T 33834-2017

PDF similar to GB/T 33834-2017


Standard similar to GB/T 33834-2017

GB/T 40244   GB/T 35930   GB/T 35924   GB/T 33839   GB/T 33838   

Basic data

Standard ID GB/T 33834-2017 (GB/T33834-2017)
Description (Translated English) Microbeam analysis -- Scanning electron microscopy -- Scanning electron microscope analysis of biological specimens
Sector / Industry National Standard (Recommended)
Classification of Chinese Standard G04
Classification of International Standard 71.040.40
Word Count Estimation 12,158
Date of Issue 2017-05-31
Date of Implementation 2018-04-01
Quoted Standard GB/T 21636; GB/T 23414
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China, Standardization Administration of the People's Republic of China
Summary This standard specifies the technical requirements and specifications for the scanning electron microscopy of biological samples. This standard applies to various types of scanning electron microscopy.

GB/T 33834-2017: Microbeam analysis -- Scanning electron microscopy -- Scanning electron microscope analysis of biological specimens


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Microbeam analysis - Scanning electron microscopy - Scanning electron microscope analysis of biological specimens ICS 71.040.40 G04 National Standards of People's Republic of China Micro - beam analysis of scanning electron microscopy Biological sample scanning electron microscopy analysis method 2017-05-31 released 2018-04-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface III Introduction IV 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 Basic principles 2 5 equipment and materials 3 6 Sample 4 7 Observation and Analysis Step 5 8 results statement 6 9 exception handling 6 10 Analysis Results Report 6 Appendix A (informative) Formulation of commonly used fixatives 7

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. This standard is proposed by the National Microparraph Analysis Standardization Technical Committee (SAC/TC38). The drafting of this standard. Zhejiang University, Tongji University, the Second People's Liberation Army Medical University, Fudan University. The main drafters of this standard. Hong Jian, Chen Hanmin, Rong Nianhang, Zhu Jian, Yang Yongji, Yu Zhang.

Introduction

Scanning electron microscopy is an analytical instrument for observing the surface morphology and ultrastructure of solid samples, requiring sample drying and surface conduction. Most biological samples (animals, plants and microbes) have a high moisture content, are not conductive, and are easily observed during scanning electron microscopy. Shrinkage in the territory of deformation, resulting in the destruction of the true form of structure, and can not get good structural information. Therefore, the need to use chemical or physical Means to deal with biological samples in order to maximize the retention of the original sample for scanning electron microscopy observation and analysis. With the electron microscope Technology development, in the scanning electron microscopy biological samples on the basis of conventional chemical treatment methods, but also the development of a number of new physical processing techniques such as frozen Scanning electron microscopy technology, and in practice has been a good application. In order to regulate the preparation of scanning electron microscopy biological samples, the correct guidance of biological experiments Like the scanning electron microscopy analysis work, it is necessary to develop biological samples of scanning electron microscopy method of national standards. Micro - beam analysis of scanning electron microscopy Biological sample scanning electron microscopy analysis method

1 Scope

This standard specifies the technical requirements and specifications for biological sample scanning electron microscopy analysis. This standard applies to various types of scanning electron microscopy.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. GB/T 21636 Microbeam Analysis Electron Probe Microanalysis (EPMA) Terminology GB/T 23414 Microbeam Analysis - Scanning Electron Microscopy Terminology

3 terms and definitions

The terms and definitions defined in GB/T 23414 and GB/T 21636 and the following terms and definitions apply to this document. 3.1 Electron gun electrongun The electron beam in the electron microscope consists of an emitter (heated tungsten wire, lanthanum hexaboride LaB6 filament, cold field or thermal field emission tip) Electronic accelerating system. 3.2 Electron beam A beam of electrons focused by the electronic optical system onto the surface of the specimen. 3.3 Accelerated voltage acceleratingvoltage The potential difference between the filament and the anode is added to accelerate the electrons emitted from the electron source. 3.4 Biological sample biologicalspecimens A variety of animal, plant and microbial samples with or in the form of life for scanning electron microscopy. 3.5 Secondary electron secondaryelectron Electrons emitted from the surface of the specimen due to incident electrons. Note. Electrons with energy less than 50 eV are usually referred to as secondary electrons. 3.6 Backscatter electrons backscatteredelectron Electrons emitted from the electron incident surface of the sample by the backscattering process. Note. Often the energy of more than 50eV electrons called backscattered electrons.

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