SJ/T 11654-2016 PDF English
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SJ/T 11654-2016: General Specification for Solid State Disk---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/SJT11654-2016
SJ
ELECTRONIC INDUSTRY STANDARD
ICS 35.220.20
L 63
Report No..
General Specification for Solid State Disk
Issued on. APRIL 05, 2016
Implemented on. SEPTEMBER 01, 2016
Issued by. Ministry of Industry and Information Technology of the People’s
Republic of China
Table of Contents
Foreword... 3
1 Scope... 4
2 Normative References... 4
3 Terms and Definitions... 5
4 Requirements... 7
5 Test Method... 12
6 Quality Assessment Procedures... 20
7 Marking, Packaging, Transportation, and Storage... 22
Appendix A (Informative) Product Appearance and Installation Size... 24
Appendix B (Informative) Interface... 28
Appendix C (Normative) Failure judgment... 34
Foreword
This Standard was drafted as per the rules specified in GB/T 1.1-2009.
Please note some contents of this Document may involve patents. The issuing agency of this
Document shall not assume the responsibility to identify these patents.
This Standard was proposed by Electronic Information Department of Ministry of Industry and
Information Technology.
This Standard shall be under the jurisdiction of Electronic Industry Standardization Institute of
Ministry of Industry and Information Technology.
Drafting organizations of this Standard. Huazhong University of Science and Technology;
Potevio Research Institute; China Electronics Standardization Institute; Netac Technology Co.,
Ltd.; Aigo Electronics Technology Co., Ltd.; Hualan Microelectronique Co., Ltd.; Lenovo
(Beijing) Limited; Beijing Shenzhou Godson IC Design Co., Ltd.; Hangzhou Dianzi University,
and Shenzhen Chipsbank Technologies Co., Ltd.
Chief drafting staffs of this Standard. Feng Dan, Zhou Wen, Hu Yang, Tong Wei, Chen
Qingfang, Li Xiaohua, Liu Jingning, Mao Wei, Xu Jie, Ren Jianqiang, Zhang Hualong, Luo
Jianjun, Fan Lingyan, Yang Yuguang, Zhang Jinfeng, and Fan Xing.
General Specification for Solid State Disk
1 Scope
This Standard specifies the requirements, test method, quality assessment procedure, marking,
packaging, transportation and storage of solid-state disk.
This Standard is applicable to the design, production, manufacture and inspection of the solid-
state disk (hereinafter refer to as “product”); reference may also be made to other devices
containing solid-state disk functional modules.
2 Normative References
The following documents are essential to the application of this Document. For the dated
documents, only the versions with the dates indicated are applicable to this Document; for the
undated documents, only the latest version (including all the amendments) is applicable to this
Document.
GB/T 191 Packaging – Pictorial Marking for Handling of Goods
GB/T 2421.1 Environmental Testing for Electric and Electronic products - General and
Guidance
GB/T 2422 Environmental testing for electric and electronic products - Terms and
definitions
GB/T 2423.1 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests A. Cold
GB/T 2423.2 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests B. Dry heat
GB/T 2423.3 Environmental testing for electric and electronic products - Part 2.Test
methods - Test Ca. Damp heat, steady state
GB/T 2423.5 Environmental testing for electric and electronic products - Part 2.Test
methods – Test Ea and guidance. Shock
GB/T 2423.10 Environmental testing for electric and electronic products - Part 2.Test
methods – Test Fc and guidance. Vibration (Sinusoidal)
GB 4943.1-2011 Information technology equipment -Safety - Part 1.General requirements
3 Terms and Definitions
For the purposes of this Document, the following terms and definitions apply.
3.1 Solid state disk
A data storage device that uses semiconductor memory chip arrays as storage components.
3.2 Lifespan (Endurance)
Under the condition that the data is guaranteed to be correct, the number of times the solid-state
disk can normally perform read and write operations.
3.6 Write performance
The number of data bytes written to the solid-state disk per unit time or the number of write
operations per unit time.
3.7 Recoverable read error
An error occurred while reading data, and the error is recoverable within the specified number
of retries.
3.8 Unrecoverable read error
An error that is found when reading data, and the error is not recoverable within the specified
number of retries.
3.9 Power on to ready time
Time that is required from power-on to data readout.
4 Requirements
4.1 Appearance and structure
4.1.1 General requirements
There shall be no obvious dents, scratches, cracks, deformations, etc. on the surface of the
product; the surface coating shall not be blistered, cracked or peeled off; and the metal parts
shall not be rusted or otherwise mechanically damaged.
4.1.2 Structure size
4.1.2.1 1.8’’ solid-state disk
The schematic diagram of the shape and structure of 1.8’’ solid-state disk can refer to Appendix
A. The pin arrangement and its dimension can refer to Appendix B.
4.1.3 Interface
The interface of the solid-state disk can optionally support parallel interface (PATA), serial
interface (SATA), peripheral component interconnection expansion interface (PCI-E), etc.; and
the specific interface is specified by the product standard.
4.2 Power on to ready time
The maximum time from power-on to data read-write state is 2.0s.
4.3 Data transfer rate
The data transfer rate is represented by the data read and write speed of sequential read data
capability, random read data capability, sequential write data capability and random write data
capability; and their response times are specified by product standards.
4.5 Abnormal power loss protection
During normal use, if the power supply of the product is suddenly cut off, the data disk shall
not be damaged.
4.12 Electromagnetic Compatibility
4.12.1 Radio disturbance limit
The radio disturbance limit of the product shall meet the requirements specified in GB 9254.It
shall be indicated in the product standard whether it is Grade-A or Grade-B.
4.12.2 Immunity limit
The immunity limit of the product shall meet the requirements specified in GB/T 17618.
4.13 Reliability
The mean time between failures (MTBF) is used to measure the reliability level of the system.
The m1 value of the mean time between failures (MTBF) of the product shall be no less than
10000h.
4.14 Limit of restricted substance
If applicable, the limit of restricted substance of the product shall meet the requirements of
GB/T 26572.
5 Test Method
5.1 Test environmental condition
In addition to climate environmental test and reliability test, other tests in this Standard shall be
carried out under standard atmospheric conditions for testing.
5.2 Appearance and structure test
The appearance of the product is tested by manual visual inspection; the shape dimension of
the product is tested by a length measuring instrument; and the weight of the product is tested
by a precision weight measuring instrument. All tests shall meet the requirements of 4.1.
5.3 Power on to ready time test
The time interval between when the test product is powered on and ready to start read/write
operations. Repeat the test 1000 times; and then take the average value as the power on to ready
time.
5.4 Data transfer rate test
5.7 Lifespan test
Generate uninterrupted write operations on the product. Before an unrecoverable write error
occurs, count the data volume of the write operation. The daily capacity used in the test is 20GB.
The test is carried out in the following two procedures.
5.9 Security test
5.9.1 General security test
It shall be carried out according to the provisions of 1.4 in GB 4943.1-2011.
5.9.2 Touch current test
The touch current test shall be measured according to the provisions of 5.1 in GB 4943.1-2011;
its limit value shall not exceed the maximum current in Table 5A of GB 4943.1-2011.
5.11.2 Temperature lower limit test
5.11.2.1 Working temperature lower limit test
It shall be carried out according to "Test Ad" of GB/T 2423.1.The sample under test must be
subjected to initial testing, and the severity shall be the lower limit of the specified working
temperature. When the temperature reaches the specified value, turn on the power supply and
work at full load for 2h; and it shall work normally. The recovery time is 2h.
6 Quality Assessment Procedures
6.1 General rules
The product shall be inspected according to this Standard and the supplementary provisions in
the product standard during the finalization (design finalization, production finalization) and
manufacturing process, and shall meet the requirements.
6.2 Inspection classification
The product inspection specified in this Standard is divided into.
6.3.2 The type inspection shall be carried out by the quality inspection department of the
product manufacturer or the quality inspection organization designated or entrusted by the
superior competent department.
6.3.3 The number of samples under test for reliability identification in the type inspection is
determined according to the product batch, test time and cost; and the number of samples for
inspecting the rest of the inspection items is 2 sets.
6.4 Quality consistency inspection
6.4.1 Batch-by-batch inspection
6.4.1.1 Products produced in batches or produced continuously shall all be inspected batch-by-
batch. During the inspection, if there is any unqualified item, a new inspection shall be carried
out after repairing. If one item is unqualified again, the product will be judged as unqualified.
For unqualified products, they shall be repaired to qualified products before delivery.
6.4.1.2 The batch-by-batch inspection shall be carried out by the quality inspection department
of the product manufacturer.
6.4.2 Periodic inspection
6.4.2.3 Samples for periodic inspection shall be randomly selected from qualified products in
batch-by-batch inspection, and the number of test samples shall be 2 sets.
6.4.2.4 If a failure occurs or any item fails to pass during the periodic inspection, the cause of
the failure shall be found out and a failure analysis report shall be submitted. After repairing,
do the following inspections sequentially from this item.
7 Marking, Packaging, Transportation, and Storage
7.1 Package marking
7.1.1 General marking
The following information shall be marked on the outside of the packaging box, such as product
model, quantity, nominal capacity, speed transmission rate, quality, manufacturer name, address,
manufacturing date and implementation standard number of the product.
7.2 Packaging
The inner packaging shall use electrostatic shielding materials; and its surface resistivity and
electrostatic shielding performance shall meet the requirements of Class I barrier materials
defined in GJB 2605-1996.
The outer packaging box shall meet the requirements of moisture-proof, dust-proof, and shock-
proof; and there shall be a packing list, inspection certificate, spare parts, accessories, and
related random documents in the packaging box.
7.3 Transportation
The packaged product shall be able to be transported by any means of transportation. The
product is not allowed to be directly hit by rain, snow or liquid and mechanically damaged
during transportation.
7.4 Storage
The product shall be stored in the original packaging. The ambient temperature of the
warehouse where the product is stored is 0°C~40°C, and the relative humidity is 30%~80%.
SJ/T 11654-2016
SJ
ELECTRONIC INDUSTRY STANDARD
ICS 35.220.20
L 63
Report No..
General Specification for Solid State Disk
Issued on. APRIL 05, 2016
Implemented on. SEPTEMBER 01, 2016
Issued by. Ministry of Industry and Information Technology of the People’s
Republic of China
Table of Contents
Foreword... 3
1 Scope... 4
2 Normative References... 4
3 Terms and Definitions... 5
4 Requirements... 7
5 Test Method... 12
6 Quality Assessment Procedures... 20
7 Marking, Packaging, Transportation, and Storage... 22
Appendix A (Informative) Product Appearance and Installation Size... 24
Appendix B (Informative) Interface... 28
Appendix C (Normative) Failure judgment... 34
Foreword
This Standard was drafted as per the rules specified in GB/T 1.1-2009.
Please note some contents of this Document may involve patents. The issuing agency of this
Document shall not assume the responsibility to identify these patents.
This Standard was proposed by Electronic Information Department of Ministry of Industry and
Information Technology.
This Standard shall be under the jurisdiction of Electronic Industry Standardization Institute of
Ministry of Industry and Information Technology.
Drafting organizations of this Standard. Huazhong University of Science and Technology;
Potevio Research Institute; China Electronics Standardization Institute; Netac Technology Co.,
Ltd.; Aigo Electronics Technology Co., Ltd.; Hualan Microelectronique Co., Ltd.; Lenovo
(Beijing) Limited; Beijing Shenzhou Godson IC Design Co., Ltd.; Hangzhou Dianzi University,
and Shenzhen Chipsbank Technologies Co., Ltd.
Chief drafting staffs of this Standard. Feng Dan, Zhou Wen, Hu Yang, Tong Wei, Chen
Qingfang, Li Xiaohua, Liu Jingning, Mao Wei, Xu Jie, Ren Jianqiang, Zhang Hualong, Luo
Jianjun, Fan Lingyan, Yang Yuguang, Zhang Jinfeng, and Fan Xing.
General Specification for Solid State Disk
1 Scope
This Standard specifies the requirements, test method, quality assessment procedure, marking,
packaging, transportation and storage of solid-state disk.
This Standard is applicable to the design, production, manufacture and inspection of the solid-
state disk (hereinafter refer to as “product”); reference may also be made to other devices
containing solid-state disk functional modules.
2 Normative References
The following documents are essential to the application of this Document. For the dated
documents, only the versions with the dates indicated are applicable to this Document; for the
undated documents, only the latest version (including all the amendments) is applicable to this
Document.
GB/T 191 Packaging – Pictorial Marking for Handling of Goods
GB/T 2421.1 Environmental Testing for Electric and Electronic products - General and
Guidance
GB/T 2422 Environmental testing for electric and electronic products - Terms and
definitions
GB/T 2423.1 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests A. Cold
GB/T 2423.2 Environmental testing for electric and electronic products - Part 2.Test
methods - Tests B. Dry heat
GB/T 2423.3 Environmental testing for electric and electronic products - Part 2.Test
methods - Test Ca. Damp heat, steady state
GB/T 2423.5 Environmental testing for electric and electronic products - Part 2.Test
methods – Test Ea and guidance. Shock
GB/T 2423.10 Environmental testing for electric and electronic products - Part 2.Test
methods – Test Fc and guidance. Vibration (Sinusoidal)
GB 4943.1-2011 Information technology equipment -Safety - Part 1.General requirements
3 Terms and Definitions
For the purposes of this Document, the following terms and definitions apply.
3.1 Solid state disk
A data storage device that uses semiconductor memory chip arrays as storage components.
3.2 Lifespan (Endurance)
Under the condition that the data is guaranteed to be correct, the number of times the solid-state
disk can normally perform read and write operations.
3.6 Write performance
The number of data bytes written to the solid-state disk per unit time or the number of write
operations per unit time.
3.7 Recoverable read error
An error occurred while reading data, and the error is recoverable within the specified number
of retries.
3.8 Unrecoverable read error
An error that is found when reading data, and the error is not recoverable within the specified
number of retries.
3.9 Power on to ready time
Time that is required from power-on to data readout.
4 Requirements
4.1 Appearance and structure
4.1.1 General requirements
There shall be no obvious dents, scratches, cracks, deformations, etc. on the surface of the
product; the surface coating shall not be blistered, cracked or peeled off; and the metal parts
shall not be rusted or otherwise mechanically damaged.
4.1.2 Structure size
4.1.2.1 1.8’’ solid-state disk
The schematic diagram of the shape and structure of 1.8’’ solid-state disk can refer to Appendix
A. The pin arrangement and its dimension can refer to Appendix B.
4.1.3 Interface
The interface of the solid-state disk can optionally support parallel interface (PATA), serial
interface (SATA), peripheral component interconnection expansion interface (PCI-E), etc.; and
the specific interface is specified by the product standard.
4.2 Power on to ready time
The maximum time from power-on to data read-write state is 2.0s.
4.3 Data transfer rate
The data transfer rate is represented by the data read and write speed of sequential read data
capability, random read data capability, sequential write data capability and random write data
capability; and their response times are specified by product standards.
4.5 Abnormal power loss protection
During normal use, if the power supply of the product is suddenly cut off, the data disk shall
not be damaged.
4.12 Electromagnetic Compatibility
4.12.1 Radio disturbance limit
The radio disturbance limit of the product shall meet the requirements specified in GB 9254.It
shall be indicated in the product standard whether it is Grade-A or Grade-B.
4.12.2 Immunity limit
The immunity limit of the product shall meet the requirements specified in GB/T 17618.
4.13 Reliability
The mean time between failures (MTBF) is used to measure the reliability level of the system.
The m1 value of the mean time between failures (MTBF) of the product shall be no less than
10000h.
4.14 Limit of restricted substance
If applicable, the limit of restricted substance of the product shall meet the requirements of
GB/T 26572.
5 Test Method
5.1 Test environmental condition
In addition to climate environmental test and reliability test, other tests in this Standard shall be
carried out under standard atmospheric conditions for testing.
5.2 Appearance and structure test
The appearance of the product is tested by manual visual inspection; the shape dimension of
the product is tested by a length measuring instrument; and the weight of the product is tested
by a precision weight measuring instrument. All tests shall meet the requirements of 4.1.
5.3 Power on to ready time test
The time interval between when the test product is powered on and ready to start read/write
operations. Repeat the test 1000 times; and then take the average value as the power on to ready
time.
5.4 Data transfer rate test
5.7 Lifespan test
Generate uninterrupted write operations on the product. Before an unrecoverable write error
occurs, count the data volume of the write operation. The daily capacity used in the test is 20GB.
The test is carried out in the following two procedures.
5.9 Security test
5.9.1 General security test
It shall be carried out according to the provisions of 1.4 in GB 4943.1-2011.
5.9.2 Touch current test
The touch current test shall be measured according to the provisions of 5.1 in GB 4943.1-2011;
its limit value shall not exceed the maximum current in Table 5A of GB 4943.1-2011.
5.11.2 Temperature lower limit test
5.11.2.1 Working temperature lower limit test
It shall be carried out according to "Test Ad" of GB/T 2423.1.The sample under test must be
subjected to initial testing, and the severity shall be the lower limit of the specified working
temperature. When the temperature reaches the specified value, turn on the power supply and
work at full load for 2h; and it shall work normally. The recovery time is 2h.
6 Quality Assessment Procedures
6.1 General rules
The product shall be inspected according to this Standard and the supplementary provisions in
the product standard during the finalization (design finalization, production finalization) and
manufacturing process, and shall meet the requirements.
6.2 Inspection classification
The product inspection specified in this Standard is divided into.
6.3.2 The type inspection shall be carried out by the quality inspection department of the
product manufacturer or the quality inspection organization designated or entrusted by the
superior competent department.
6.3.3 The number of samples under test for reliability identification in the type inspection is
determined according to the product batch, test time and cost; and the number of samples for
inspecting the rest of the inspection items is 2 sets.
6.4 Quality consistency inspection
6.4.1 Batch-by-batch inspection
6.4.1.1 Products produced in batches or produced continuously shall all be inspected batch-by-
batch. During the inspection, if there is any unqualified item, a new inspection shall be carried
out after repairing. If one item is unqualified again, the product will be judged as unqualified.
For unqualified products, they shall be repaired to qualified products before delivery.
6.4.1.2 The batch-by-batch inspection shall be carried out by the quality inspection department
of the product manufacturer.
6.4.2 Periodic inspection
6.4.2.3 Samples for periodic inspection shall be randomly selected from qualified products in
batch-by-batch inspection, and the number of test samples shall be 2 sets.
6.4.2.4 If a failure occurs or any item fails to pass during the periodic inspection, the cause of
the failure shall be found out and a failure analysis report shall be submitted. After repairing,
do the following inspections sequentially from this item.
7 Marking, Packaging, Transportation, and Storage
7.1 Package marking
7.1.1 General marking
The following information shall be marked on the outside of the packaging box, such as product
model, quantity, nominal capacity, speed transmission rate, quality, manufacturer name, address,
manufacturing date and implementation standard number of the product.
7.2 Packaging
The inner packaging shall use electrostatic shielding materials; and its surface resistivity and
electrostatic shielding performance shall meet the requirements of Class I barrier materials
defined in GJB 2605-1996.
The outer packaging box shall meet the requirements of moisture-proof, dust-proof, and shock-
proof; and there shall be a packing list, inspection certificate, spare parts, accessories, and
related random documents in the packaging box.
7.3 Transportation
The packaged product shall be able to be transported by any means of transportation. The
product is not allowed to be directly hit by rain, snow or liquid and mechanically damaged
during transportation.
7.4 Storage
The product shall be stored in the original packaging. The ambient temperature of the
warehouse where the product is stored is 0°C~40°C, and the relative humidity is 30%~80%.
......
Source: Above contents are excerpted from the full-copy PDF -- translated/reviewed by: www.ChineseStandard.net / Wayne Zheng et al.
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