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JJG 629-2014: Verification Regulation for Polycrystalline X-ray Diffractometers
Status: Valid JJG 629: Evolution and historical versions
| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| JJG 629-2014 | English | 459 |
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Verification Regulation for Polycrystalline X-ray Diffractometers
| Valid |
JJG 629-2014
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| JJG 629-1989 | English | 399 |
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Verification Regulation for Polycrystalline X-Ray Diffractometer
| Obsolete |
JJG 629-1989
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PDF similar to JJG 629-2014
Standard similar to JJG 629-2014 JJG 631 JJG 635 JJG 695 JJG 628 Basic data | Standard ID | JJG 629-2014 (JJG629-2014) | | Description (Translated English) | Verification Regulation for Polycrystalline X-ray Diffractometers | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | A61 | | Classification of International Standard | 17.020 | | Word Count Estimation | 20,270 | | Date of Issue | 6/15/2014 | | Date of Implementation | 12/15/2014 | | Older Standard (superseded by this standard) | JJG 629-1989 | | Quoted Standard | GBZ 115-2010; JB/T 9400-2010 | | Regulation (derived from) | The State Administration of Quality Supervision, Inspection and Quarantine Notice No. 64 of 2014 | | Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine | | Summary | This Standard specifies the multi-crystal X-ray diffraction (hereinafter referred to as the instrument) the initial verification, verification and subsequent use of checks. | JJG 629-2014: Verification Regulation for Polycrystalline X-ray Diffractometers---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Verification Regulation for Polycrystalline X-ray Diffractometers
State verification procedures People's Republic of China
Multi-crystal X-ray diffractometer
Issued on. 2014-06-15
2014-12-15 implementation
The State Administration of Quality Supervision, Inspection and Quarantine released
Multi-crystal X-ray diffractometer
Verification Regulation
Diffractometers
Replacing JJG 629-1989
Focal point. the National Technical Committee on Environment stoichiometry
Main drafting unit. Shanghai Institute of Measurement and Testing
Participated in the drafting. Dandong City Institute of Measurement and Testing Technology
This procedure commissioned the National Technical Committee of the stoichiometric environment responsible for interpreting
The main drafters of this procedure.
Gongfei Yan (Shanghai Institute of Measurement and Testing)
Chai Guanghui (Institute of Measurement and Testing Technology Dandong City)
Ding Min (Shanghai Institute of Measurement and Testing)
Drafters participate.
Yang Peili (Institute of Measurement and Testing Technology Dandong City)
Chan Wing-hong (Shanghai Institute of Measurement and Testing)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2. References (1)
3 Overview (1)
4 metering performance requirements (2)
4.1 Instrument 2θ angle indication error (2)
4.2 Instrument 2θ angle Repeatability (2)
4.3 Instrument Resolution (2)
4.4 detector spectrum resolution (2)
4.5 Stability diffraction intensity (2)
5 General Requirements (2)
5.1 Appearance (2)
5.2 safety indicators (2)
6 Control of measuring instruments (3)
6.1 Verification condition (3)
6.2 Verification Project (3)
6.3 Verification Methods (4)
6.4 test results processing and verification cycle (7)
Appendix A multi-crystal X-ray diffraction test original records (for reference) (8)
Appendix B test certificates/test results in the notice page and format (11)
Appendix C of the standard reference material verification diffraction angle (14)
Introduction
This procedure is JJG 629-1989 "multi-crystal X-ray diffractometer" revision. The preparation of the procedures reference
GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards", JB/T 9400-2010 "X shoot
Ray diffraction instrument technical conditions. " Compared with JJG 629-1989, in addition to editorial changes outside the main technical changes are as follows.
--- Abolished the old statutes theodolite and altimeter using only standard materials instrument 2θ angle indication error
Difference for examination.
--- Remove the original protocol verification project "tube voltage and current stability."
--- Canceled instrument rating.
--- Reference JB/T 9400-2010 "X-ray diffraction technology", when the diffraction intensity stability test
Room to 8h.
--- Original statutes test project "X-ray scattering dose" was renamed "scattered radiation leakage air kerma rate"
Technical indicators and methods reference GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards."
The previous versions of the release JJG 629 case.
JJG 629-1989.
Multi-crystal X-ray diffraction test procedures
1 Scope
The order applies to multi-crystal X-ray diffraction (hereinafter referred to as equipment) initial verification, use and subsequent verification
Check.
2. References
This procedure references the following documents.
GB Z115-2010 X-ray diffraction and fluorescence analyzer health protection standards
JB/T 9400-2010 X-ray diffraction technique condition
For dated references, only the dated edition applies to this procedure; undated reference documents
Member, the latest edition (including any amendments) applies to this procedure.
3 Overview
Multi-crystal X-ray diffractometer with a particle detector to detect and record the X-ray generator diffraction on polycrystalline aggregates
Sophisticated analytical instruments. Instrument by measuring the diffraction angle, combined with quantum chemical calculations, measurements of crystal powder substance
Structure, lattice constants, phase composition and other structural parameters.
The basic principles of instrumentation is based on Bragg equation, the equation is given by equation (1).
2d (hkl) sinθ = nλ (1)
Where.
d (hkl) --- spacing, nm;
θ --- diffraction angle, (°);
n --- diffraction orders;
λ --- X-ray wavelength, nm.
Where h, k, l is an integer of three prime, it represents the crystal plane index. λ depends on the female X-ray tube used
Pole (target) of metallic materials.
The basic structure of multi-crystal X-ray diffraction is shown in Fig.
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