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JJF 1016-2014 (JJF1016-2014)

Chinese standards (related to): 'JJF 1016-2014'
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JJF 1016-2014English175 Add to Cart 0--3 minutes. Auto immediate delivery. The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments JJF 1016-2014 Valid JJF 1016-2014
JJF 1016-2009English399 Add to Cart 3 days The Rules for Drafting Program of Pattern. Evaluation of Measuring Instruments JJF 1016-2009 Obsolete JJF 1016-2009
JJF 1016-2002English319 Add to Cart 3 days The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments JJF 1016-2002 Obsolete JJF 1016-2002
JJF 1016-1990English279 Add to Cart 2 days Rules for Drafting Norms of Pattern Evaluation of Measuring Instruments JJF 1016-1990 Obsolete JJF 1016-1990


   
BASIC DATA
Standard ID JJF 1016-2014 (JJF1016-2014)
Description (Translated English) The Rules for Drafting Program of Pattern Evaluation of Measuring Instruments
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A50
Classification of International Standard 17.020
Word Count Estimation 15,122
Date of Issue 2014/1/23
Date of Implementation 2014/7/23
Older Standard (superseded by this standard) JJF 1016-2009
Quoted Standard JJF 1002-2010; JJF 1051; JJF 1094; GB/T 17799.1; GB/T 17799.2
Adopted Standard OIMI NO.19, NEQ
Drafting Organization Beijing Institute of Metrology Detection
Administrative Organization National Technical Committee of Legal Metrology Metering Management
Regulation (derived from) AQSIQ Announcement No. 10, 2014
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This Standard specifies the type evaluation outline prepared by metering equipment.


JJF 1016-2014: PDF in English
JJF 1016-2014
NATIONAL METROLOGY TECHINICAL SPECIFICATION
OF THE PEOPLE’S REPUBLIC OF CHINA
The Rules for Drafting Program of
Pattern Evaluation of Measuring Instruments
ISSUED ON: JANUARY 23, 2014
IMPLEMENTED ON: JULY 23, 2014
Issued by: General Administration of Quality Supervision, Inspection and
Quarantine of the People's Republic of China
______________________________________________________________
Jurisdiction organization: National Technical Committee on Legal Metrology
and Management Metrology
Drafting organizations: Beijing Institute of Metrology
Beijing Municipal Administration of Quality and
Technology Supervision
China Institute of Metrology
National Technical Committee on Legal Metrology and Management Metrology
is entrusted for interpretation of this Rules
Replacing JJF 1016-2009
The Rules for Drafting Program of
Pattern Evaluation of Measuring
Instruments
Drafters of this Rules:
Wang, Zigang (Beijing Institute of Metrology)
Chen, Jinghua (Beijing Municipal Administration of Quality and Technology
Supervision)
He, Zhao (China Institute of Metrology)
Table of Contents
Introduction ... 5
1 Scope ... 6
2 References ... 6
3 Terms and definitions ... 6
3.1 Single product ... 6
3.2 Series product ... 6
4 General ... 7
5 Composition of the program of pattern evaluation ... 7
6 Contents of each component of the program of pattern evaluation ... 8
6.1 Cover ... 8
6.2 Title page ... 8
6.3 Table of contents ... 8
6.4 Introduction ... 9
6.5 Scope ... 9
6.6 References ... 9
6.7 Terms ... 9
6.8 General ... 10
6.9 Legal management requirements... 10
6.10 Measurement requirements ... 11
6.11 General technical requirements ... 11
6.12 List of pattern evaluation items ... 14
6.13 Number of prototypes provided and way of using a prototype ... 14
6.14 Test methods and conditions of test items and data processing and
qualification criteria ... 15
6.15 List of measuring instruments and equipment used in test items ... 16
6.16 Pattern evaluation record format ... 16
7 Editing detailed rules ... 16
Annex A Pattern evaluation record format ... 17
Introduction
JJF 1016-2014 “The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments” is a guiding technical specification for formulating a
program of pattern evaluation. It shall also refer to relevant product standards
when formulating a program of pattern evaluation.
JJF 1016-2014 “The Rules for Drafting Program of Pattern Evaluation of
Measuring Instruments” is revised by referring to part of the content of the
International Organization of Legal Metrology (OIML) Document No. 19
“Pattern evaluation and pattern approval”, combined with the relevant
requirements put forward by the metrology administrative department.
Compared with JJF 1016-2009, in addition to editorial changes, the main
changes in the technical requirements of this Rules are as follows:
- ADD the terms “single product” and “series product” (see 3.1 and 3.2);
- PUT FORWARD the requirements for using classification codes in the
“scope” (see 6.5);
- REFINE the formulating method for electromagnetic environment (immunity)
(see 6.11.3.3);
- PUT FORWARD the clear formulating requirements for stability tests (see
6.11.4);
- ADD “Number of prototypes provided and way of using a prototype” (see
6.13); PUT FORWARD the principle requirements for the way of providing
a prototype and using a prototype;
- ADD the “List of measuring instruments and equipment used in the test item”
(see 6.15);
- ADD the “Pattern evaluation record format” (see 6.16);
- DELETE the content about the software evaluation.
The previous released versions replaced by this Rules are as follows:
- JJF 1016-2009;
- JJF 1016-2002;
- JJF 1016-1990.
The Rules for Drafting Program of
Pattern Evaluation of Measuring Instruments
1 Scope
This Rules applies to the drafting of program of pattern evaluation of measuring
instruments.
2 References
JJF 1002-2010 The rules for drafting national metrological verification
regulation
JJF 1051 Designation and classification code for measuring instrument
JJF 1094 Evaluation of the characteristics of measuring instruments
GB/T 17799.1 Electromagnetic compatibility - Generic standards - Immunity
for residential, commercial and light-industrial environments
GB/T 17799.2 Electromagnetic compatibility - Generic standards - Immunity
for industrial environments
For dated references, only the edition cited applies. For undated references,
the latest edition of the referenced document (including any amendments)
applies.
3 Terms and definitions
For the purpose of this Rules, the terms and definitions defined in JJF 1001
“General Terms in Metrology and Their Definitions” and the following apply.
3.1 Single product
A product of only one specification or model.
3.2 Series product
A group of products having the same measurement principle, similar structure
(appearance) and satisfying one of the following conditions:
a) the accuracy is the same, but the measurement range is different;
b) the accuracy is different, but the measurement range is the same and the
structure is the same.
4 General
The program of pattern evaluation of measuring instruments is the technical
basis for the pattern evaluation of measuring instruments, and its drafting shall
meet the following requirements:
- it shall comply with the relevant laws and regulations;
- it shall actively adopt international recommendations, international
standards and international documents;
- the requirements for each item shall have a basis, including national
metrology technical specifications, national standards, industry standards,
etc.;
- the test method shall be scientific and operable;
- the textual expression is of rigorous structure, clear hierarchy, accurate
wording;
- the terms, symbols, codes, etc. used shall be consistent and comply with
the requirements of relevant national standards;
- the formula, table, and diagram data shall be correct.
5 Composition of the program of pattern evaluation
The composition and drafting sequence of the program of pattern evaluation
are as follows:
- cover;
- title page;
- table of contents;
- introduction;
- scope;
- references;
- terms;
- general;
- legal management requirements;
- metrological requirements;
- general technical requirements;
- a list of pattern evaluation items;
- number of prototypes provided and way of using a prototype;
- test methods and conditions of the test item and data processing and
qualification criteria;
- a list of measuring instruments used in the test item;
- Annex A -- Pattern evaluation record format.
6 Contents of each component of the program of
pattern evaluation
6.1 Cover
The cover includes the name, serial number, issuing (approval) organization,
and date of implementation of the program of pattern evaluation (in English and
Chinese). The name of the measuring instrument in the name of the program
of pattern evaluation shall be the name in the “Catalogue of Measuring
Instruments administered by the People's Republic of China (Pattern Approval
Section)”.
6.2 Title page
The title page includes information such as the jurisdiction organization, drafting
organization, and drafter.
6.3 Table of contents
The table of contents shall list the serial number, title and page number of the
clause, first-level subclause and annex. The title and page number are
connected by a dotted line.
6.4 Introduction
The introduction is not numbered and shall include the following: the rules on
which the program is based; extent or situation of using technical standards
such as international recommendations, international documents, international
standards, national standards, and industry standards. If the program is revised,
it shall also include the following: a description of all or part of the other
documents replaced by the program; the serial number and name of the
program or other documents being replaced; the main technical changes
compared to the previous edition; whether it is necessary to re-evaluate or
partially evaluate the previously approved pattern of an item; the previous
released versions replaced the pattern.
6.5 Scope
The name and classification code shall be given according to JJF 1051. If the
measuring instrument may have other names, it shall be listed in detail. If
necessary, it shall clearly write out the measuring instruments that are not
applicable.
The following typical terms are recommended:
“This program of pattern evaluation is applicable to the pattern evaluation of
×××× with the classification code of ××××.”
6.6 References
The serial number and name of the references shall be listed. The list of
references is in the order of: national metrology technical regulations, national