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GB/T 41072-2021: Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
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Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
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GB/T 41072-2021
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PDF similar to GB/T 41072-2021
Basic data | Standard ID | GB/T 41072-2021 (GB/T41072-2021) | | Description (Translated English) | Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis | | Sector / Industry | National Standard (Recommended) | | Classification of Chinese Standard | G04 | | Word Count Estimation | 22,231 | | Issuing agency(ies) | State Administration for Market Regulation, China National Standardization Administration | GB/T 41072-2021: Surface chemical analysis - Electron spectroscopies - Guidelines for ultraviolet photoelectron spectroscopy analysis
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Surface chemical analysis -- Electron spectroscopies -- Guidelines for ultraviolet photoelectron spectroscopy analysis
ICS 71:040:40
CCSG04
National Standards of People's Republic of China
Surface Chemical Analysis Electron Spectroscopy
UV Photoelectron Spectroscopy Guide
Published on 2021-12-31
2022-04-01 Implementation
State Administration for Market Regulation
Released by the National Standardization Administration
directory
Preface III
Introduction IV
1 Scope 1
2 Normative references 1
3 Terms and Definitions 1
4 Symbols and Abbreviations 1
5 Overview 2
5:1 Energy level relationship 2
5:2 Instrument structure 2
5:3 Test process 3
6 Sample preparation 5
6:1 Overview 5
6:2 Material Type 5
6:3 Specimen morphology 6
6:4 Sample installation 6
6:5 Sample Handling 7
7 Instrument Calibration 7
7:1 Overview 7
7:2 Instrument Check7
7:3 Calibration of the instrument energy scale 8
7:4 Instrument Settings 8
8 Sample charge evaluation9
8:1 Collecting the XPS spectrum of C1s 9
8:2 Charge Assessment 9
9 Full Scan and Narrow Scan 9
9:1 Overview 9
9:2 Data collection 9
9:3 Data Analysis 10
10 Test report 12
Appendix A (Informative) Example of Surface Scanning Ion Beam Etching of Au Reference Material 14
Appendix B (Informative) UV Photon Energy under Different Excitation Light Sources 15
Reference 16
foreword
This document is in accordance with the provisions of GB/T 1:1-2020 "Guidelines for Standardization Work Part 1: Structure and Drafting Rules of Standardization Documents"
drafted:
This document is proposed and managed by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38):
Please note that some content of this document may be patented: The issuing agency of this document assumes no responsibility for identifying patents:
This document was drafted by: Institute of Chemistry, Chinese Academy of Sciences, Sun Yat-Sen University:
The main drafters of this document: Zhao Zhijuan, Liu Fen, Zou Ye, Xie Fangyan, Chen Jian, Zhang Xiaoyu:
Introduction
Photoelectron spectroscopy is one of the most important and effective analytical methods for studying the surface of solid materials: Equipped with X-ray Photoelectron Spectroscopy
Ultraviolet photoelectron spectroscopy on the instrument can be used to obtain the energy distribution information of valence electrons in solid materials, which is an important method to study the work function and valence band of the material surface:
An efficient method for the structure (density of states), the energy resolution of which can reach about 100 meV, in the fields of solid state physics, surface science and materials science, etc:
have important applications: As the research on semiconductor devices and photocatalytic materials becomes more and more extensive, their preparation and performance regulation require the valence electrons of the materials:
The band structure can be accurately measured:
Surface Chemical Analysis Electron Spectroscopy
UV Photoelectron Spectroscopy Guide
1 Scope
This document provides guidance for instrument operators to perform UV photoelectron spectroscopy analysis of solid material surfaces, including sample handling, spectrometer calibration
Calibration and setup, spectral acquisition, and final reporting:
This document applies to the analysis of typical samples by operators of X-ray photoelectron spectrometers equipped with a vacuum ultraviolet light source:
2 Normative references
The contents of the following documents constitute essential provisions of this document through normative references in the text: Among them, dated citations
documents, only the version corresponding to that date applies to this document; for undated references, the latest edition (including all amendments) applies to this document
document:
GB/T 22461-2008 vocabulary of surface chemical analysis
GB/T 22571-2017 Calibration of energy scale of X-ray photoelectron spectrometer for surface chemical analysis
GB/T 27025-2019 General requirements for the competence of testing and calibration laboratories
3 Terms and Definitions
Terms and definitions defined in GB/T 22461-2008 apply to this document:
4 Symbols and Abbreviations
The following symbols and abbreviations apply to this document:
ARPES: angle-resolved photoemission spectroscopy
EA: electron affinity (electronaffinity)
Eb: photoelectron binding energy (bindingenergyofphotoelectron)
ECBM: bottom of conduction band (conductionbandminimum)
Ecutoff: Secondary electron cutoff (secondaryelectroncutoff)
EF: Fermi level (fermilevel)
Eg: forbidden band width (also called band gap) (bandgap)
EHOMO: HOMO energy level, the highest occupied molecular orbital (highest occupied molecular orbital)
Ek: kinetic energy of photoelectron
ELUMO: LUMO energy level, the lowest unoccupied molecular orbital (lowest unoccupied molecular orbital)
Evac: vacuum level (vacuumlevel)
EVBM: valence band maximum (valencebandmaximum)
IP: ionization potential
UPS: Ultraviolet Photoelectron Spectroscopy
hν: incident photon energy (incidentphotonenergy)
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