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Std ID |
Description (Standard Title) |
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SJ/T 11439-2015
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Information technology-General specification of area type two-dimensional bar code reading engine
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SJ/T 11440-2012
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Satellite Navigation difference scheme
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SJ/T 11441-2012
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General specification inkjet paper media
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SJ/T 11442-2012
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Evaluation method of work safety standardization for electronic information enterprises
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SJ/T 11443-2012
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Classification for external field and other temporary places hazardous operation of electronic information enterprise
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SJ/T 11444-2012
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Requirements of hazard identification, risk assessment, and risk control for the electronic information industry
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SJ/T 11445.2-2012
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IT Service. Outsourcing. Part 2: Specifications for Data Protection
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SJ/T 11446-2013
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General Specification for ionizing electrostatic eliminators
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SJ/T 11447-2013
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(Preparation of regulations electronics industry construction project feasibility study report)
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SJ/T 11448-2013
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Code of Software Park Planning and Design
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SJ/T 11449-2013
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Technical specifications for engineering of central conditioning electronic billing information systems
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SJ/T 11450-2013
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Specification for energy consumption norm of silicon single crystal grower
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SJ/T 11451-2013
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Specification for energy consumption norm of diffusion furnace
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SJ/T 1145-1993
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Test methods for electrical performances of organic film for use in capacitors
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SJ/T 11452-2013
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Specification for energy consumption norm of pusher furnace used in production of vacuum-tubes
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SJ/T 11453-2013
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Specification for energy consumption norm of belt conveyor furnace
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SJ/T 11454-2013
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(Ferrite ring core coating dimensions and tolerances)
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SJ/T 11455-2013
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Methods measurement of oscilloscope tubes and indicator tubes
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SJ/T 11456-2013
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Measuring methods for black and white television picture tubes
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SJ/T 11457.1-2013
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(Waveguide type dielectric resonators - Part 1: Generic specification)
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SJ/T 11457.4.1-2013
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Waveguide type dielectric resonators. Part 4-1: Blank detail specification
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SJ/T 11457.4-2013
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Waveguide type dielectric resonators. Part 4: Sectional specification
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SJ/T 11458-2013
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LED ofr liquid crystal display backlight unit performance specification
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SJ/T 11459.2.2.1-2013
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Liquid crystal display devices. Part 2-2-1: Matrix colour LCD module for automotive applications. Detail specification
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SJ/T 11459.2.2.2-2013
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Liquid crystal display devices. Part2-2-2: Matrix colour LCD modules for monitor. Detail specification
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SJ/T 11459.2.2.3-2013
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Liquid crystal display devices. Part 2-2-3: Matrix colour LCD modules for Notebook PC. Detail specification
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SJ/T 11459.2.2.4-2013
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Liquid crystal display devices. Part 2-2-4: Matrix colour LCD modules for mobile phone. Detail specification
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SJ/T 11459.2.2.5-2016
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(Section 2-2-5 liquid crystal display device: a TV show detailed specification for module color matrix LCD)
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SJ/T 11459.7.1-2014
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(The liquid crystal display devices - Part 7-1: Passive liquid crystal display window shape and size preferred series)
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SJ/T 11460.1-2013
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Backlight units for liquid crystal displays. Part 1: Generic specification
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SJ/T 11460.2-2014
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Backlight units for liquid crystal displays. Part 2: Cold Cathode Fluorescent Lamp (CCFL) backlight units. Blank detailspecification
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SJ/T 11460.3.1-2014
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Backlight units for liquid crystal displays. Part 3-1: LED backlight unit for portable display. Blank detail specification
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SJ/T 11460.3.2-2013
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Backlight units for liquid crystal displays. Part 3-2: LED backlight unit for monitor. Blank detail specification
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SJ/T 11460.3.3-2016
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(LCD with backlight assembly - Part 3-3: Blank television receiver with LED backlight assembly Detail specification)
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SJ/T 11460.6.1-2015
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Backlight unit for liquid crystal display. Part 6-1: Measuring method of optical and optoelectrical parameters
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SJ/T 11460.6.2-2015
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Backlight unit for liquid crystal display. Part 6-2: Measuring methods of dynamic optical and optoelectrical parameters
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SJ/T 11461.1.1-2013
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Organic light emitting diode(OLED)displays. Part 1-1: Generic specifications
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SJ/T 11461.2-2016
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Organic light emitting diode displays--Part 2: Essential ratings and characteristics
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SJ/T 11461.3-2016
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(The organic light emitting diode displays - Part 3: Sectional specification display)
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SJ/T 11461.4-2016
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(Part 4 of the organic light emitting diode display: a display module specification)
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SJ/T 11461.5.1-2013
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Organic light emitting diode(OLED)displays. Part 5-1: Environmental testing methods
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SJ/T 11461.5.2-2016
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(Part 5-2 organic light emitting diode display device: Mechanical test methods)
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SJ/T 11461.5.3-2016
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(Part 5-3 organic light emitting diode display device: Test methods and life afterimage)
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SJ/T 11461.6.2-2016
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(Organic light emitting diode display devices - Part 6-2: Test methods - Visual quality)
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SJ/T 1146-1993
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Test methods for bulk resistivity of organic film for use in capacitors
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SJ/T 11462.1-2013
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Encoders for use in electronic equipment. Part 1: Generic specification
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SJ/T 11462.2.1-2016
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(Electronic encoder equipment - Part 2-1: Blank detail specification incremental rotary encoder Assessment level EZ)
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SJ/T 11462.2-2016
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(Electronic encoder equipment - Part 2: Sectional specification incremental rotary encoder)
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SJ/T 11462.3.1-2016
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(Electronic encoder equipment - Part 3-1: Blank detail specification absolute rotary encoders Assessment level EZ)
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SJ/T 11462.3-2016
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(Electronic encoder equipment - Part 3: Sectional specification absolute rotary encoder)
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SJ/T 11463-2013
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Specification for software research and development cost measurement
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SJ/T 11464-2013
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(Electronic Industrial production units of production safety accident emergency management system to establish guidelines)
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SJ/T 11465-2014
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Application technical requirement for Internet TV receiver
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SJ/T 11466-2014
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Infrared remote control receiving amplifier
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SJ/T 11467-2014
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[SJ/Z 11467-2014] Risk of risk assessment for hazardous substances in electrical and electronic products
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SJ/T 11468-2014
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Restriction of hazardous substances in electrical and electronic products. Terminology
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SJ/T 11469-2014
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Test methods for the piezoelectric properties of ceramics shear piezoelectric strain constant d15 testing on quasi-static principle
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SJ/T 11470-2014
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(Light-emitting diode epitaxial wafers)
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SJ/T 11471-2014
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Measurement methods for epitaxial wafers of light-emitting diodes
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SJ/T 1147-1993
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Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors
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SJ/T 11472-2014
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Tinned copper-clad aluminum wire
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SJ/T 11473-2014
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Control wires and cables with cross-linked polyethylene insulation copper-plating screen
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SJ/T 11474-2014
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Specification for flexible protective cap for radio-frequency connectors
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SJ/T 11475-2014
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UV curable coating for optical fibre
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SJ/T 11476.2-2014
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Material for optical fiber preform. Part 2: Germanium tetrachloride
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SJ/T 11476.3-2014
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Material for optical fibre preform Part 3: Jacket tube
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SJ/T 11477-2014
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IP core deliverables specification
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SJ/T 11478-2014
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IP core quality evaluation
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SJ/T 11479-2014
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IP documentation guide
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SJ/T 11480-2014
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(Anti-static dust cloth general specification)
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SJ/T 11481-2014
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Prepreg used as bonding sheets for multilayer printed boards. Cyanate ester modified epoxy resin-impregnated glass cloth
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SJ/T 1148-1993
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Test methods for breakdown strength of organic film for use in capacitors
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SJ/T 11482-2014
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Varistors for use in electronic equipment-Detail specification for chip varistors of type MYP-Assessment level E
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SJ/T 11483-2014
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Electrodeposited copper foil for lithium ion battery
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SJ/T 11484-2015
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Aluminum doped zinc oxide type transparent conductive oxide coated glass
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SJ/T 11485-2015
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LED type naming rules
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SJ/T 11486-2015
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Technical specification for low power light. emitting diode chips
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SJ/T 11487-2015
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Non-contact measurement method for the resistivity of semi-insulating semiconductor wafer
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SJ/T 11488-2015
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Test method for measuring resistivity, hall coefficient and determining hall mobility in semi-insulating GaAs single crystals
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SJ/T 11489-2015
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Test method for measuring etch pit density (EPD) in low dislocation density indium phosphide wafers
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SJ/T 11490-2015
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Test method for measuring etch pit density (EPD) in low dislocation density gallium arsenide wafers
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SJ/T 11491-2015
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Test methods for measurement of interstitial oxygen content in silicon by short baseline infrared absorption spectrometry
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SJ/T 11492-2015
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Test methods for measurement of composition of gallium arsenide phosphide wafers by photoluminescence
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SJ/T 11493-2015
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Test method for measuring nitrogen concentration in silicon substrates by secondary ion mass spectrometry
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SJ/T 11494-2015
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Test methods for photoluminescence analysis of single crystal silicon for III-V impurities
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SJ/T 11495-2015
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Guide to conversion factors for interstitial oxygen in silicon
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SJ/T 11496-2015
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Determination of boron concentration in gallium arsenide by infrared absorption
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SJ/T 11497-2015
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Test method for thermal stability testing of gallium arsenide wafers
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SJ/T 11498-2015
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Test method for measuring oxygen contamination in heavily doped silicon substrates by secondary ion mass spectrometry
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SJ/T 11499-2015
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Test method for measuring electrical properties of monocrystalline silicon carbide
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SJ/T 11500-2015
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Test method for measuring crystallographic orientation of monocrystalline silicon carbide
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SJ/T 11501-2015
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Test method for determining crystal type of monocrystalline silicon carbide
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SJ/T 11502-2015
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Specification for polished monocrystalline silicon carbide wafers
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SJ/T 11503-2015
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Test methods for measuring surface roughness of polished monocrystalline silicon carbide wafers
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SJ/T 11504-2015
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Test method for measuring surface quality of polished monocrystalline silicon carbide
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SJ/T 11505-2015
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Sapphire single crystal polished wafers specification
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SJ/T 11506-2015
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Aluminum etching solution for Integrated Circuit
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SJ/T 11507-2015
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Oxide coating etching buffer for integrated circuit
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SJ/T 11508-2015
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Positive Photoresist developer for Integrated Circuit
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SJ/T 11509-2015
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ITO etching solution for liquid crystal display
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