| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| YS/T 14-1991 | English | 199 |
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Days<=2
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(Measurement heteroepitaxial layer and the polycrystalline silicon layer thickness)
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YS/T 14-1991
| Obsolete |
YS/T 14-1991
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