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YD/T 3037.2-2023

Chinese Standard: 'YD/T 3037.2-2023'
Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)See DetailStatusRelated Standard
YD/T 3037.2-2023EnglishRFQ ASK Days<=3 (Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminals - Part 2: UICC) YD/T 3037.2-2023 Valid YD/T 3037.2-2023

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