| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ/T 2658.9-2015 | English | 149 |
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Days<=3
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Measuring method for semiconductor infiared-emitting diode. Part 9: Spatial distribution of radiant intensity and half-intensity angle
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SJ/T 2658.9-2015
| Valid |
SJ/T 2658.9-2015
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