| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ 21635-2021 | English | 839 |
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Days<=6
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(Semiconductor integrated circuits-Asynchronous dual-port static random access memory (SRAM) test method)
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SJ 21635-2021
| Valid |
SJ 21635-2021
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