| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ 21634-2021 | English | 619 |
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Days<=5
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(Semiconductor integrated circuits - Multi-node low-voltage differential signaling (M-LVDS) test methods)
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SJ 21634-2021
| Valid |
SJ 21634-2021
|