| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| SJ 1551-1979 | English | 199 |
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Days<=2
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Method of measurement for resistivity of silicon epitaxial layer (capacitance-voltage method) (Provisional)
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SJ 1551-1979
| Obsolete |
SJ 1551-1979
|