| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| JJG(SJ)04009-1987 | English | 279 |
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Days<=3
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(BJ2983-type transistor being biased second breakdown tester pilot test procedures)
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JJG(SJ)04009-1987
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JJG(SJ)04009-1987
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