| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 4937.14-2018 | English | 279 |
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Days<=3
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Semiconductor devices -- Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
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GB/T 4937.14-2018
| Valid |
GB/T 4937.14-2018
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