| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 41751-2022 | English | 189 |
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Days<=3
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Test method for radius of curvature of crystal plane in GaN single crystal substrate wafers
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GB/T 41751-2022
| Valid |
GB/T 41751-2022
|