| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 20176-2025 | English | 444 |
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Days<=4
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Surface chemical analysis - Secondary-ion mass spectrometry - Determination of boron atomic concentration in silicon using uniformly doped materials
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GB/T 20176-2025
| Valid |
GB/T 20176-2025
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