| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 19921-2005 | English | 439 |
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Days<=3
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Test method of particles on silicon wafer surfaces
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GB/T 19921-2005
| Obsolete |
GB/T 19921-2005
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