| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 19444-2004 | English | 134 |
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Days<=3
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Oxygen precipitation characterization of silicon wafers by measurement of interstitial oxygen reduction
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GB/T 19444-2004
| Valid |
GB/T 19444-2004
|