| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 14146-2021 | English | 259 |
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Days<=3
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Test method for carrier concentration of silicon epitaxial layers - Capacitance-voltage method
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GB/T 14146-2021
| Valid |
GB/T 14146-2021
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