| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | See Detail | Status | Related Standard |
| GB/T 13388-1992 | English | 239 |
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Days<=2
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Method for measuring crystallographic orientation of flats on single crystal sillcon slices and wafers by X-ray techniques
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GB/T 13388-1992
| Obsolete |
GB/T 13388-1992
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