YD/T 3037.1-2023 PDF English
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| YD/T 3037.1-2023 | English | RFQ | ASK | 3 days [Need to translate] | (Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal) |
| YD/T 3037.1-2016 | English | 1359 | Add to Cart | 6 days [Need to translate] | Test methods for USB characteristic between UICC and ternninal interfiace - Part 1: Terminal |
| YD/T 3037.1-2015 | English | RFQ | ASK | 3 days [Need to translate] | (Universal Integrated Circuit Card (UICC) and USB interface characteristics between the terminal test methods - Part 1: Terminal) |
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Basic data
| Standard ID | YD/T 3037.1-2023 (YD/T3037.1-2023) |
| Description (Translated English) | (Test method for characteristics of mass storage interface between Universal Integrated Circuit Card (UICC) and terminal - Part 1: Terminal) |
| Sector / Industry | Telecommunication Industry Standard (Recommended) |
| Classification of Chinese Standard | M36 |
| Date of Issue | 2023-12-20 |
| Date of Implementation | 2024-04-01 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This standard specifies the testing method for the characteristics of the large-capacity storage interface between the Universal Integrated Circuit Card (UICC) on the terminal and the terminal, mainly including: electrical characteristics, establishment of initial communication protocol, performance testing and functional testing. This standard applies to the development and production of terminal interfaces that support large-capacity storage interfaces. |
