YB/T 4462-2015 PDF English
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Basic data
| Standard ID | YB/T 4462-2015 (YB/T4462-2015) |
| Description (Translated English) | High purity ferrosilicon. Determination of boron content. Inductively coupled plasma atomic emission spectrometric method |
| Sector / Industry | Ferrous Metallurgy Industry Standard (Recommended) |
| Classification of Chinese Standard | H11 |
| Classification of International Standard | 77.100 |
| Word Count Estimation | 9,951 |
| Date of Issue | 2015-04-30 |
| Date of Implementation | 2015-10-01 |
| Quoted Standard | GB/T 4010; GB/T 6682; GB/T 12806; GB/T 12807; GB/T 12808 |
| Regulation (derived from) | Ministry of Industry and Information Technology Announcement (2015 No. 28) |
| Issuing agency(ies) | Ministry of Industry and Information Technology |
| Summary | This Standard specifies the determination of boron in high purity ferrosilicon by inductively coupled plasma atomic emission spectrometry (ICP-AES). This Standard applies to the determination of boron in high purity ferrosilicon. Measurement range (mass fraction): 0.001% to 0.010%. |
