SJZ329-1972 PDF English
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| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/Z 329-1972 | English | 199 | Add to Cart | 2 days [Need to translate] | (Tungsten creep test, the high temperature treatment and metallographic examination methods) |
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Basic data
| Standard ID | SJ/Z 329-1972 (SJ/Z329-1972) |
| Description (Translated English) | (Tungsten creep test, the high temperature treatment and metallographic examination methods) |
| Sector / Industry | Electronics Industry Standard |
| Word Count Estimation | 5,528 |
| Date of Issue | 9/5/1972 |
| Date of Implementation | 1/1/1973 |