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SJ/T 11993-2025 PDF English

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SJ/T 11993-2025: Testing method for the pad cratering of printed circuit board assembly
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SJ/T 11993-2025English289 Add to Cart 3 days [Need to translate] Testing method for the pad cratering of printed circuit board assembly

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Basic data

Standard ID SJ/T 11993-2025 (SJ/T11993-2025)
Description (Translated English) Testing method for the pad cratering of printed circuit board assembly
Sector / Industry Electronics Industry Standard (Recommended)
Classification of Chinese Standard L30
Classification of International Standard 31.18
Word Count Estimation 13,142
Date of Issue 2025-05-09
Date of Implementation 2025-08-01
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the test procedures, result expression, and test report requirements for printed circuit board component pad cracking. This document applies to the evaluation test of the cracking resistance of rigid printed circuit boards and component pads.

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