SJ/T 1147-1993 PDF English
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SJ/T 1147: Historical versions
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/T 1147-1993 | English | 179 | Add to Cart | 2 days [Need to translate] | Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors |
| SJ 1147-1977 | English | RFQ | ASK | 3 days [Need to translate] | (Chinese Industry Standard) |
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Basic data
| Standard ID | SJ/T 1147-1993 (SJ/T1147-1993) |
| Description (Translated English) | Test methods for dielectric loss angle tangent and dielectric canstant of organic film for use in capacitors |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L90 |
| Word Count Estimation | 3,335 |
| Date of Issue | 12/17/1993 |
| Date of Implementation | 6/1/1994 |
| Older Standard (superseded by this standard) | SJ 1147-1977 |
| Quoted Standard | SJ/T 1145; SJ/T 1146 |
| Regulation (derived from) | Industry-Science (2010) No. 77 |
| Summary | This standard applies to a thickness under normal weather conditions or under 2 ~ 50��m organic thin film capacitors with high temperature, the frequency of the measured values ??and the tangent of the dielectric loss angle of the dielectric constant 50Hz, 1kHz or 1MHz time. |