SJ/T 11210-1999 PDF English
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| SJ/T 11210-1999 | English | 529 | Add to Cart | 3 days [Need to translate] | Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz |
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Basic data
| Standard ID | SJ/T 11210-1999 (SJ/T11210-1999) |
| Description (Translated English) | Measurement of quartz crystal unit parameters. Part 4: Method for the measurement of the load resonance frequency fL, load resonance resistance Rland the calculation of other derived values of quartz crystal units, up to 30 MHz |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L71 |
| Word Count Estimation | 15,121 |
| Date of Issue | 8/26/1999 |
| Date of Implementation | 12/1/1999 |
| Adopted Standard | IEC 444-4-1998, IDT |
| Summary | This standard specifies the frequency up to 30MHz quartz crystal element load resonant frequency f (L) and load resonance resistance R (L) of a simple measurement method. From these two measurements can be calculated as defined by IEC 122-1 modification of a load resonant frequency offset �� f (L), the frequency pulling range �� f (L1L2) and pulling sensitivity S. This standard uses a measurement series resonant frequency f (L) and f when the crystal element in series with a load capacitance C (L) is generated when (L) of the change (i. e., �� f (L)). Measurement accuracy is mainly determined by the accuracy of the load capacitance calibration accuracy and frequency measurements. |
