SJ/T 11011-2015 PDF English
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SJ/T 11011: Historical versions
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ/T 11011-2015 | English | 209 | Add to Cart | 3 days [Need to translate] | (Electronics ICP-AES test method silver brazing filler metal impurity content of lead, bismuth, zinc, cadmium, iron, magnesium, aluminum, tin, antimony, phosphorus) |
| SJ/T 11011-1996 | English | 199 | Add to Cart | 3 days [Need to translate] | Analytical methods for pure silver brazing for electron device. Determination of lead by dithizone spectrophotometry |
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Basic data
| Standard ID | SJ/T 11011-2015 (SJ/T11011-2015) |
| Description (Translated English) | (Electronics ICP-AES test method silver brazing filler metal impurity content of lead, bismuth, zinc, cadmium, iron, magnesium, aluminum, tin, antimony, phosphorus) |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L90 |
| Word Count Estimation | 9,969 |
| Date of Issue | 2015-10-10 |
| Date of Implementation | 2016-04-01 |
| Older Standard (superseded by this standard) | SJ/T 11011-1996; SJ/T 11012-1996; SJ/T 11013-1996; SJ/T 11014-1996; SJ/T 11015-1996; SJ/T 11016-1996; SJ/T 11017-1996; SJ/T 11019-1996 |
| Regulation (derived from) | PRC MIIT Announcement 2015 No.63 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |