SJ/T 10481-1994 PDF English
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| SJ/T 10481-1994 | English | 319 | Add to Cart | 3 days [Need to translate] | Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques |
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Basic data
| Standard ID | SJ/T 10481-1994 (SJ/T10481-1994) |
| Description (Translated English) | Test method for resistivity of silicon epitaxial layers by area contacts three-probe techniques |
| Sector / Industry | Electronics Industry Standard (Recommended) |
| Classification of Chinese Standard | L34 |
| Word Count Estimation | 8,828 |
| Date of Issue | 4/11/1994 |
| Date of Implementation | 10/1/1994 |
| Regulation (derived from) | Industry-Science (2010) No. 77 |