SJ 967-1975 PDF English
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ 967-1975 | English | RFQ | ASK | 3 days [Need to translate] | (Silicon Switching Diode Test Methods zero bias capacitance) |
Click to Preview a similar PDF
Basic data
| Standard ID | SJ 967-1975 (SJ967-1975) |
| Description (Translated English) | (Silicon Switching Diode Test Methods zero bias capacitance) |
| Sector / Industry | Electronics Industry Standard |
| Date of Issue | 6/1/1976 |
| Date of Implementation | 6/1/1976 |
