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SJ 26-1979 PDF English

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SJ 26-1979: Method of life test for low power electronic tubes
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SJ 26: Historical versions

Std IDVersionUSDBuyDeliver [PDF] inTitle (Description)
SJ 26-1979English419 Add to Cart 3 days [Need to translate] Method of life test for low power electronic tubes
SJ 26-1964EnglishRFQ ASK 3 days [Need to translate] (Chinese Industry Standard)

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Basic data

Standard ID SJ 26-1979 (SJ26-1979)
Description (Translated English) Method of life test for low power electronic tubes
Sector / Industry Electronics Industry Standard
Classification of Chinese Standard L35
Classification of International Standard 31.1
Word Count Estimation 12,131
Date of Issue 5/26/1964
Date of Implementation 6/1/1980
Adopted Standard ��������, NEQ
Regulation (derived from) Industry-Science (2010) No. 77
Summary This standard applies to the anode dissipation power less than 25W of continuous tube, and provides a method of life test and the life test equipment.

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