SJ 21634-2021 PDF English
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Basic data
| Standard ID | SJ 21634-2021 (SJ21634-2021) |
| Description (Translated English) | (Semiconductor integrated circuits - Multi-node low-voltage differential signaling (M-LVDS) test methods) |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L56 |
| Classification of International Standard | 31.200 |
| Word Count Estimation | 28,214 |
| Date of Issue | 2021-12-27 |
| Date of Implementation | 2022-03-01 |
| Issuing agency(ies) | Ministry of Industry and Information Technology |