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SJ 2151-1982 PDF English

Std IDVersionUSDBuyDeliver [PDF] inTitle (Description)
SJ 2151-1982EnglishRFQ ASK 3 days [Need to translate] (Silicon transistor current steady flow test method temperature coefficient)

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Basic data

Standard ID SJ 2151-1982 (SJ2151-1982)
Description (Translated English) (Silicon transistor current steady flow test method temperature coefficient)
Sector / Industry Electronics Industry Standard
Date of Issue 8/20/1982
Date of Implementation 1/1/1983

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