SJ 20613-1996 PDF English
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| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| SJ 20613-1996 | English | 639 | Add to Cart | 3 days [Need to translate] | Methods of measurement for a.c. thin film electroluminescent matrix display devices |
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Basic data
| Standard ID | SJ 20613-1996 (SJ20613-1996) |
| Description (Translated English) | Methods of measurement for a.c. thin film electroluminescent matrix display devices |
| Sector / Industry | Electronics Industry Standard |
| Classification of Chinese Standard | L34 |
| Classification of International Standard | 31.02 |
| Word Count Estimation | 16,164 |
| Date of Issue | 8/30/1996 |
| Date of Implementation | 1/1/1997 |
| Quoted Standard | GB 4597; GJB 360A |
| Summary | This standard specifies the exchange matrix thin film electroluminescent display device, test conditions, test procedures and test methods. This standard applies to AC thin film electroluminescent matrix display (hereinafter referred to as the display device) Optical parametric tests. |
