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JJG(SJ)04034-1989 PDF English

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JJG(SJ)04034-1989: (GR1731M analog IC test system test procedures)
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JJG(SJ)04034-1989English1439 Add to Cart 7 days [Need to translate] (GR1731M analog IC test system test procedures)

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Basic data

Standard ID JJG(SJ)04034-1989 (JJG(SJ)04034-1989)
Description (Translated English) (GR1731M analog IC test system test procedures)
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A56
Word Count Estimation 41,000
Date of Issue 11/6/1905
Drafting Organization IC Test Technology Center
Administrative Organization Testing Research Center electronic metering machinery and electronics industry
Summary This standard applies to test GR-1731M film intended IC test system.

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