JJG(SJ)04020-1989 PDF English
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Basic data
| Standard ID | JJG(SJ)04020-1989 (JJG(SJ)04020-1989) |
| Description (Translated English) | Specification for verification of sample transistor specially intended to measure the noise factor of high frequency medium and low power triode transistor |
| Sector / Industry | Metrology & Measurement Industry Standard |
| Classification of Chinese Standard | A56 |
| Word Count Estimation | 6,000 |
| Date of Issue | 11/6/1905 |
| Drafting Organization | Testing Research Center electronic metering machinery and electronics industry |
| Administrative Organization | Testing Research Center electronic metering machinery and electronics industry |
| Summary | This standard applies to small and medium-power high-frequency crystal blue diode test, test frequency noise figure measurement sample tubes were dedicated 600MHz and 1000MHz. This procedure also applies to the inspection side of the ordinary high frequency of small and medium power transistor. |