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JJF 1818-2020: Calibration Specification for Calibration Device of Raman Spectrometers
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JJF 1818-2020English299 Add to Cart 3 days [Need to translate] Calibration Specification for Calibration Device of Raman Spectrometers

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Basic data

Standard ID JJF 1818-2020 (JJF1818-2020)
Description (Translated English) Calibration Specification for Calibration Device of Raman Spectrometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A60
Classification of International Standard 17.180
Word Count Estimation 15,126
Date of Issue 2020
Date of Implementation 2020-04-17
Issuing agency(ies) State Administration for Market Regulation

JJF 1818-2020: Calibration Specification for Calibration Device of Raman Spectrometers


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
(Calibration specification of Raman spectrometer calibration device) National Metrology Technical Specifications of the People's Republic of China Calibration specification for Raman spectrometer calibration device 2020-01-17 released 2020-04-17 implementation Issued by the State Administration for Market Regulation Raman spectrometer calibration device Calibration specification Focal point. National Medical Metrology Technical Committee Main drafting unit. China Institute of Metrology Participated in the drafting. Heilongjiang Metrological Verification and Testing Institute Jiangxi Institute of Metrology and Testing Guizhou Metrology and Testing Institute This specification entrusts the National Medical Metrology Technical Committee to interpret The main drafters of this specification. Dingxiang (China Institute of Metrology) Tang Xiuhua (Heilongjiang Metrological Verification and Testing Institute) Zhong Mengqin (Jiangxi Institute of Metrology and Testing) Participating drafters. Li Jiangchao (China Institute of Metrology) Zhang Jiyan (China Institute of Metrology) Zhou Xuanchao (Guizhou Metrology and Testing Institute)

table of Contents

Introduction (Ⅱ) 1 scope (1) 2 Reference documents (1) 3 Terms and measurement units (1) 4 Overview (1) 5 Measurement characteristics (1) 5.1 Raman frequency shift of standard silicon wafer (1) 5.2 Relative strength of standard glass (1) 6 Calibration conditions (2) 6.1 Environmental conditions (2) 6.2 Measurement standards and other equipment (2) 7 Calibration items and calibration methods (2) 7.1 Visual inspection (2) 7.2 Raman frequency shift (2) 7.3 Relative strength (2) 8 Calibration result expression (3) 8.1 Calibration record (3) 8.2 Processing of calibration results (3) 9 Recheck interval (3) Appendix A Raman spectrometer calibration device calibration original record (recommended) format style (4) Appendix B. Internal page of calibration certificate (recommended) format (5) Appendix C Evaluation Example of Measurement Uncertainty (7)

Introduction

The compilation of this specification is based on JJF 1071-2010 "Rules for the Compilation of National Metrology and Calibration Specifications", JJF 1001-2011 "General Metrology Terms and Definitions" and JJF 1059.1-2012 "Evaluation and Expression of Measurement Uncertainty" as the basis and basis According to data, and mainly refer to JJF 1544-2015 "Raman Spectrometer Calibration Specification" and ASTME1683-02 (2014) "Standard Practice for Testing the Scanning Raman Spectrometer" (Standard Practice for Testing the PerformanceofScanningRamanSpectrometers). This specification is released for the first time. Calibration specification for Raman spectrometer calibration device

1 Scope

This specification applies to the calibration of Raman spectrometer calibration devices.

2 Reference documents

This specification refers to the following documents. JJF 1544-2015 Raman Spectrometer Calibration Specification ASTME1683-02 (2014) Scanning Raman Spectrometer Performance Test Standard Operation Specification (Standard PracticeforTestingthePerformanceofScanningRamanSpectrometers) For dated reference documents, only the dated version applies to this specification; for undated references The latest version (including all amendments) is applicable to this specification.

3 Terms and units of measurement

The terms and definitions specified in JJF 1544-2015 "Raman Spectrometer Calibration Specification" and the following terms and definitions apply to this specification. 3.1 Raman shift Ramanshift The frequency change of Raman scattered light relative to the excitation light, referred to as "frequency shift", in cm-1. 3.2 relative intensity relative intensity The normalized result of Raman scattering intensity relative to the maximum intensity value.

4 overview

The Raman spectrometer calibration device is composed of standard silicon wafers, standard glass and atomic line lamps. The Raman peak of the standard silicon wafer near 520cm-1 is used to calibrate the frequency shift indication error of the Raman spectrometer. standard Glass is a glass doped with metal oxides, which can generate a stable and continuous spectral signal under laser excitation for calibration The relative intensity of the Raman spectrometer. The atomic spectrum emitted by the atomic spectrum lamp is a natural reference and is used to calibrate the Raman spectrometer Spectral resolution, frequency shift repeatability and other parameters.

5 Metrological characteristics

5.1 Standard silicon wafer Raman frequency shift The expanded uncertainty of the center frequency shift of the Raman peak near 520cm-1 is U≤0.5cm-1 (k=2). 5.2 Relative strength of standard glass The expanded uncertainty of relative strength U≤5% (k=2). Note. The above indicators are not used as eligibility criteria, only for reference. ...

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