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Calibration Specification for Polarization Dependent Loss Meters
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Basic data
| Standard ID | JJF 1690-2018 (JJF1690-2018) |
| Description (Translated English) | Calibration Specification for Polarization Dependent Loss Meters |
| Sector / Industry | Metrology & Measurement Industry Standard |
| Classification of Chinese Standard | A60 |
| Word Count Estimation | 18,193 |
| Date of Issue | 2018-02-27 |
| Date of Implementation | 2018-05-27 |
| Regulation (derived from) | AQSIQ Announcement No. 26 of 2018 |
| Issuing agency(ies) | General Administration of Quality Supervision, Inspection and Quarantine |
JJF 1690-2018: Calibration Specification for Polarization Dependent Loss Meters
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Polarization Dependent Loss Meters
National Metrology Technical Specification of the People's Republic
Polarization dependent loss tester calibration specification
Published on.2018-02-27
2018-05-27 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Polarization dependent loss tester
Calibration specification
Focal Point. National Optical Metrology Technical Committee
Main drafting unit. The 41st Research Institute of China Electronics Technology Group Corporation
China Institute of Metrology
Participated in the drafting unit. Communication and Measurement Center of the Ministry of Industry and Information Technology
This specification entrusts the National Optical Metrology Technical Committee to explain
The main drafters of this specification.
Wang Hengfei (The 41st Research Institute of China Electronics Technology Group Corporation)
Li Guochao (The 41st Research Institute of China Electronics Technology Group Corporation)
Xu Nan (China Institute of Metrology)
Participate in the drafters.
Ying Chengping (The 41st Research Institute of China Electronics Technology Group Corporation)
Li Jian (China Institute of Metrology)
Fu Dongbo (Communication and Measurement Center, Ministry of Industry and Information Technology)
table of Contents
Introduction (II)
1 Scope (1)
2 References (1)
3 terms and units of measurement (1)
3.1 Polarization dependent loss (1)
4 Overview (1)
4.1 Principle of Polarization Scanning Method (1)
4.2 Principle of Mueller Matrix Method (2)
4.3 Jones matrix principle (2)
5 Measurement characteristics (3)
5.1 Polarization dependent loss indication error (3)
5.2 Polarization-dependent loss measurement repeatability (3)
6 Calibration conditions (3)
6.1 Environmental conditions (3)
6.2 Measurement standards and other equipment (3)
7 Calibration items and calibration methods (4)
7.1 Calibration Project (4)
7.2 Calibration method (4)
8 calibration result expression (5)
9 re-interval time interval (5)
Appendix A Calibration Original Record Reference Format (6)
Appendix B Recommended Format for Calibration Certificate (7)
Appendix C Example of Uncertainty Evaluation (8)
Introduction
JJF 1071-2010 "National Metrology Calibration Specification Writing Rules", JJF 1001-2011 "General Measurement Terms and
Definitions, JJF 1059.1-2012 "Measurement Uncertainty Evaluation and Representation" together constitute the basis for the development of this calibration specification
Basic series regulations.
This specification refers to GB/T 18311.2-2001 "Basic testing and measurement of fiber optic interconnect devices and passive components"
Procedures Part 3-2. Testing and Measuring the Polarization Dependence of Single Mode Fiber Optics - Test Method A, Test
Device requirements and other related sections.
This specification was first developed.
Polarization dependent loss tester calibration specification
1 Scope
This specification applies to the calibration of a polarization dependent loss tester.
2 reference files
This specification refers to the following documents.
GB/T 18311.2-2001 Basic test and measurement procedures for fiber optic interconnect devices and passive devices
Part 3-2. Inspection and measurement of polarization dependence of single mode fiber optics
For dated references, only dated versions apply to this specification; undated quotations
The latest version (including all amendments) applies to this specification.
3 terms and units of measure
The following terms and definitions apply to this calibration specification.
3.1 polarization dependent loss polarizationdependentloss (PDL)
The maximum change in output optical power of the optical device or optical network output port when the transmitted optical signal changes in the full polarization state
Quantity, in dB, as defined in equation (1).
PDL=Pmax-Pmin (1)
In the formula.
Pmax---the maximum output optical power of the output port under the full polarization state of the device under test, dBm;
Pmin---the minimum output optical power of the output port under the full polarization state of the device under test, dBm.
4 Overview
Polarization dependent loss tester is mainly used in fiber optic and fiber optic devices (including couplers, optical circulators, optical connectors)
And wavelength division multiplexer, etc.) Test of PDL technical indicators in the process of development, production and testing. Currently, polarization
The methods used in the loss tester are mainly the polarization scanning method, the Mueller matrix method and the Jones matrix method.
4.1 Principle of polarization scanning method
Polarization scanning method is the basic method of testing PDL. It completes the test according to the definition of PDL. Its testing principle is as follows.
Figure 1 shows. The light output from the light source undergoes a random change in the polarization state after the polarization scanning module, due to the polarization of the device under test.
Depending on the loss characteristics, the optical power received by the photodetector changes as the polarization state changes. When the polarization scanning module scans
When the time is long enough, the polarization state of the device under test is sufficient, that is, from the series of data received by the photodetector,
The PDL of the device under test is obtained by its definition.
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