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JJF 1329-2011 PDF English

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JJF 1329-2011: Calibration Specification for Instantaneors Spectral Instruments
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JJF 1329: Historical versions

Std IDVersionUSDBuyDeliver [PDF] inTitle (Description)
JJF 1329-2011English509 Add to Cart 4 days [Need to translate] Calibration Specification for Instantaneors Spectral Instruments
JJF 1329-1990English239 Add to Cart 2 days [Need to translate] (From 0. 1 to 100 mW laser power reference operating technical specifications)

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Basic data

Standard ID JJF 1329-2011 (JJF1329-2011)
Description (Translated English) Calibration Specification for Instantaneors Spectral Instruments
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A60
Classification of International Standard 17.180
Word Count Estimation 22,267
Date of Issue 2011-12-28
Date of Implementation 2012-03-28
Quoted Standard JJG 383-2002; JJG 768-2005; JJF 1032-2005; CIE 105-1993
Regulation (derived from) AQSIQ Announcement No. 205 of 2011
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine
Summary This standard applies to the wavelength range of 250nm ~ 1750nm, the source of the measured flash duration �� 1X10 ^ (-4) transient spectrometer calibration. Other types of transient spectrometer can be calibrated with reference to the specification.

JJF 1329-2011: Calibration Specification for Instantaneors Spectral Instruments


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Instantaneors Spectral Instruments People's Republic of China National Metrology Technical Specifications Transient spectrometer calibration specification Issued on. 2011-12-28 2012-03-28 implementation The State Administration of Quality Supervision, Inspection and Quarantine released Transient spectrometer calibration specification Sp This specification by the State Administration of Quality Supervision, Inspection and Quarantine approved on December 28, 2011, and from From March 28, 2012 into effect. Focal point. the National Technical Committee on Optical metrology The main drafting units. China North Industries second ○ five Institute Participated in the drafting unit. China Testing Technology Research Institute China Aerospace Science and Industry Corporation third Institute eighth three hundred fifty-eight Institute This specification committee commissioned by the National Optical measurement technology is responsible for interpreting The main drafters of this specification. Wubao Ning (second ○ five Institute of China North Industries) Fan JI Hong (second ○ five Institute of China North Industries) Drafters participate. Cao Yuansheng (China Testing Technology Research Institute) Jiancheng (China Aerospace Science and Industry Corporation third Institute eighth three hundred fifty-eight Institute) YU Bing (China North Industries second ○ five Institute)

table of Contents

1 Scope (1) 2. References (1) 3 Terms (1) 4 Overview (1) 5 Metrological characteristics (2) 5.1 Transient ultraviolet spectrometer (2) 5.2 Transient visible spectrometer (2) 5.3 Transient near infrared spectrometer (2) 6 calibration conditions (3) Environmental conditions 6.1 (3) 6.2 standards and measuring equipment (3) 7 calibration items and calibration methods (4) 7.1 calibration items (4) 7.2 Calibration method (4) 8 Recalibration interval (7) Appendix A calibration certificate page format (8) Appendix B Calibration original record format (9) Appendix C Measurement Uncertainty (10) Transient spectrometer calibration specification

1 Scope

This standard applies to the wavelength range of 250nm ~ 1750nm, time flash metering source of ≥1 × 10-4s Transient spectrometer calibration. Other types of transient spectrometer calibration may refer to this specification. 2. References This specification references the following documents. JJG383-2002 spectral radiance standard lamp JJG768-2005 Emission Spectrometer JJF 1032-2005 optical radiation measurement terminology and definitions CIE105.1993 pulsed light radiation source spectral radiance measurement (SpectroradiometryofPulsedOptical RadiationSources) For dated references, only the dated edition applies to this specification; undated reference documents Member, the latest edition (including any amendments) applies to this specification.

3 Terms

3.1 Transient Spectroscopy instantaneousspectrum Having transient characteristics of electromagnetic waves by wavelength or frequency sequence arranged in the order. 3.2 flash time flashingtime Once the duration of the intermittent light emission.

4 Overview

Transient spectroscopy is used to measure the flash light source spectral characteristics of the transient time instrument ≥1 × 10-4s, the core Optical technology is transient perturbation spectroscopy and spurious secondary spectrum Reduction Technology. According wavelength division transient spectroscopy into purple External transient spectroscopy, visible transient spectroscopy, near-infrared transient spectrometer. Transient Spectrometer composition shown in Figure 1. 1 entrance slit receiving incident light source under test, and by plane incident After reflecting mirror 2, a first spherical mirror 3 is collimated into parallel light, and then dispersed into a plane blazed grating 4 a Toe flat spectral lines, and then through the second spherical mirror 5 ultraviolet, visible or near infrared spectrum filtered by the filter Accurate imaging linear CCD detector photosensitive surface 6 through linear CCD detector 6 into electrical signals, 7 and 8 high-speed data acquisition and storage system processing signals from the CCD driver amplifier, data processing by the computer 9 Show the measured spectra and calibration parameters back. ...

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