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GB/T 33783-2017: Testing guideline for programmable logic device software
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GB/T 33783-2017	English	319	Add to Cart	4 days [Need to translate]	Testing guideline for programmable logic device software

GB/T 33783-2017: Testing guideline for programmable logic device software

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Testing guideline for programmable logic device software ICS 35.080 L77 National Standards of People's Republic of China Programmable Logic Device Software Testing Guide 2017-05-31 released 2017-12-01 implementation General Administration of Quality Supervision, Inspection and Quarantine of the People's Republic of China China National Standardization Management Committee released Directory Preface III 1 Scope 1 2 normative reference document 1 3 Terms and definitions 1 4 Test purpose 1 5 test content 2 6 Test Management 2 6.1 Process Management 2 6.2 Configuration Management 3 6.3 Review management 3 7 Test Level 3 7.1 Unit Test 3 7.2 Configuration Item Test 4 7.3 System Testing 4 Test process 4 8.1 Test planning 4 8.2 Test design and implementation 5 8.3 Test execution 5 8.4 Test summary 6 9 Test Type 6 9.1 Document review 6 9.2 Code Review 7 9.3 Code Walk 7 9.4 logic test 7 9.5 Functional tests 7 9.6 performance test 7 9.7 timing test 8 9.8 Interface Test 8 9.9 Strength test 8 9.10 Balance test 8 9.11 security test 8 9.12 Boundary Test 8 9.13 Power Analysis 9 Test Method 9 10.1 Design Check 9 10.2 function anti-true 9 10.3 Gate level protection 9 10.4 timing simulation 9 10.5 Static Timing Analysis 10.6 Logical equivalence check 10 10.7 Physical test 10 Appendix A (informative) Programmable logic device Software test level Correspondence with test type 11 Appendix B (informative) Programmable logic device Software test type Correspondence with test method 12

Foreword

This standard is drafted in accordance with the rules given in GB/T 1.1-2009. Please note that some of the contents of this document may involve patents. The issuer of this document does not assume responsibility for the identification of these patents. This standard is proposed and centralized by the National Information Technology Standardization Technical Committee (SAC/TC28). The drafting unit of this standard. China Aerospace Science and Industry Group, the third Institute of the Institute of the Institute of China, the Institute of Electronic Technology Standardization, China Aerospace Science and Technology Group No. 107 Institute, China Civil Aviation Southwest Regional Authority, Beijing Road Communication Signal Research and Design Institute Group Limited company. The main drafters of this standard. Yu Linyu, Zhang Jinrong, Liu Jun, Zhang Guoyu, Zhu Lin, Liu Wei, Wang Ying, Yang Nan, Wang Dong, Song Wen, Wei Weibo, Zhang Yangyang, Yang Guizhi, Xu Jingren, Peng Ming, Liu Xiaojian, Yu Xiuming, Hao Shouqin, Yang Guanglun, Meng Wei, Lv Zonghui, Yu Runze, DIAO Li-feng, YANG Yuan, LI Zhuo, HUANG Yong, GAO Yuan, YAO Ke-cheng Programmable Logic Device Software Testing Guide

1 Scope

This standard specifies the purpose, content, management, level, process, type and method of programmable logic device software testing. This standard applies to the testing of programmable logic device software.

2 normative reference documents

The following documents are indispensable for the application of this document. For dated references, only the dated edition applies to this article Pieces. For undated references, the latest edition (including all modifications) applies to this document. Information technology - Software generation cycle process GB/T Software engineering terminology GB/T 11457-2006 Information technology - Software life cycle process configuration management - GB/T 20158-2006 General requirements for software development for programmable logic devices GB/T 33781-2017 GB/T 33784-2017 Programmable Logic Device Software Documentation Specification

3 terms and definitions

The following terms and definitions, as defined in GB/T 11457-2006 and GB/T 33781-2017, apply to this document. 3.1 Programmable logic device software system programmablelogicdevicesoftwaresystem A set of programmable logic device software configuration items that have a connection relationship with each other. 3.2 Working condition Voltage factors and temperature factors that affect the delay of programmable logic devices. 3.3 Typical operation state Programmable logic device rated voltage, rated temperature. 3.4 Maximum working condition maximal workingcondition Programmable logic device operating at the lowest voltage, maximum temperature. 3.5 Minimum working conditions Programmable logic device operating at the highest voltage, minimum temperature.

4 test purpose

The purpose of the programmable logic device software test is to. a) Verify that the programmable logic device software meets the contract or development technical requirements, system/subsystem design documentation, requirements specification ...