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High-voltage test techniques - Very-fast-front overvoltage measurements
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High-voltage testing techniques with very fast impulses. Part 1: Measuring systems for very fast front overvoltages generated in gas-insulated substations
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Basic data
| Standard ID | GB/T 18134-2025 (GB/T18134-2025) |
| Description (Translated English) | High-voltage test techniques - Very-fast-front overvoltage measurements |
| Sector / Industry | National Standard (Recommended) |
| Classification of Chinese Standard | K40 |
| Classification of International Standard | 19.080 |
| Word Count Estimation | 30,359 |
| Date of Issue | 2025-10-05 |
| Date of Implementation | 2026-05-01 |
| Older Standard (superseded by this standard) | GB/T 18134.1-2000 |
| Issuing agency(ies) | State Administration for Market Regulation and Standardization Administration of China |
GB/T 18134-2025: High-voltage test techniques - Very-fast-front overvoltage measurements
---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
ICS 19.080
CCSK40
National Standards of the People's Republic of China
Replaces GB/T 18134.1-2000
High Voltage Testing Technology. Rapid Wavefront Overvoltage Measurement
Published on 2025-10-05
Implemented on May 1, 2026
State Administration for Market Regulation
The State Administration for Standardization issued a statement.
Table of contents
Preface III
1.Scope 1
2 Normative References 1
3.Terms and Definitions 1
4.Characteristics of ultra-fast wavefront overvoltage 2
4.1 Overview 2
4.2 Characteristics of Internal Ultra-Fast Wavefront Overvoltage 2
4.3 Characteristics of transient casing voltage 3
4.4 Characteristics of External Fast Wavefront Overvoltage
5.Measurement system for ultra-fast wavefront overvoltage
5.1 General Rules 5
5.2 Measurement methods and basic requirements of the measurement system 5
5.2.1 Measurement Methods 5
5.2.2 Basic Requirements 7
5.3 Transmission Characteristics of the Measurement System 8
5.3.1 Transfer characteristics of the measurement system for internal ultra-fast wavefront overvoltage 8
5.3.2 Transfer characteristics of a measurement system for transient enclosure voltage 8
5.3.3 Transfer characteristics of the measurement system for external ultra-fast wavefront overvoltage 9
5.3.4 Determination of the transmission characteristics of the measurement system 9
5.4 Verification Procedure for the Measurement System 9
5.4.1 Verification Procedure for the Internal Fast Wavefront Overvoltage Measurement System 9
5.4.2 Verification procedure for transient enclosure voltage measurement system 10
5.4.3 Verification Procedure for External Fast Wavefront Overvoltage Measurement System 10
Appendix A (Informative) Explanation of the characteristics of ultra-fast wavefront overvoltage 11
A.1 Main components of ultra-fast wavefront overvoltage 11
A.1.1 Main components of internal ultra-fast wavefront overvoltage 11
A.1.2 Main Components of Transient Casing Voltage 11
A.1.3 Main Components of External Fast Wavefront Overvoltage 11
A.2 Generation of Transient Shell Voltage (TEV) and External Fast Wavefront Overvoltage 11
Appendix B (Informative) Estimation of Uncertainty in Measurement of Peak Value of Fast Wavefront Overvoltage 13
B.1 Sources of Measurement Uncertainty 13
B.1.1 Sources of uncertainty in the measurement of peak value of internal ultra-fast wavefront overvoltage 13
B.1.2 Sources of measurement uncertainty for transient casing voltage peak value 14
B.1.3 Sources of uncertainty in the measurement of peak value of external ultra-fast wavefront overvoltage 14
B.2 Simplified Procedure for Estimating the Measurement Uncertainty of Peak Value of Fast Wavefront Overvoltage 15
B.2.1 Simplified procedure for estimating the measurement uncertainty of the peak value of the internal ultra-fast wavefront overvoltage 15
B.2.2 Simplified procedure for estimating the measurement uncertainty of transient case voltage peak 18
B.2.3 Simplified procedure for estimating the measurement uncertainty of peak external fast wavefront overvoltage 18
B.3 Example 19.Estimating the measurement uncertainty of peak value of ultra-fast wavefront overvoltage
Appendix C (Informative) Step Wave Generator 20
Appendix D (Normative) Method for Determining the Frequency Characteristics of a Measurement System Based on Time-Domain Characteristics Experiments 21
D.1 High-frequency cutoff frequency estimation 21
D.2 Low-frequency cutoff frequency estimation 21
References 22
Figure 1.Origin, classification, and location of action of ultra-fast wavefront overvoltages.
Figure 2.Example of internal ultra-fast wavefront overvoltage 3
Figure 3.Example of transient casing voltage 4
Figure 4.Example of external fast wavefront overvoltage 5
Figure 5.Schematic diagram of a capacitive voltage divider sensor using an insulating film capacitor as the low-voltage arm.
Figure 6.Schematic diagram of the Newi probe.
Figure 7.Schematic diagram of the electric field probe.
Figure 8.Schematic diagram of a capacitive voltage divider sensor.
Figure 9.Schematic diagram of an integrated optoelectronic electric field probe.
Figure A.1 Schematic diagram of the generation principle of TEV and external ultra-fast wavefront overvoltage 12
Figure C.1 Schematic diagram of step wave generator 20
Table B.1 Frequency Domain
Table B.2 Frequency Domain
Table B.3 Time Domain
Table B.4 Time Domain
Table B.5 Frequency Domain
Table B.6 Frequency Domain
Table B.7 Time Domain
Table B.8 Time Domain
Table B.9 Example 19.Estimating the measurement uncertainty of the peak value of the internal fast wavefront overvoltage.
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents".
Drafting.
This document replaces GB/T 18134.1-2000 "Extremely Fast Impulse High Voltage Testing Techniques - Part 1.Gas-Insulated Substations with Steep Voltages".
The main technical changes in "Measurement System for Wavefront Overvoltage" compared to GB/T 18134.1-2000, apart from structural adjustments and editorial modifications, are as follows.
as follows.
a) The wording of "range" has been changed, and the limitation on the time parameter range has been removed (see Chapter 1, Chapter 1 of the.2000 edition);
(b) The terms and definitions defined in GB/T 2900.19-2022 and GB/T 2900.20-2016 are added to apply to this document (see section [number]).
Chapter 3);
c) Change "Definitions" to "Terms and Definitions," and incorporate the revised content from the.2000 edition, adding "Transmission Characteristics" and...
The terms "rise time" and their definitions are in Chapter 3 (Chapter 3,.2000 edition).
d) A chapter on "Characteristics of Ultra-Fast Wavefront Overvoltages" has been added, and relevant content from the.2000 edition has been revised and incorporated (see Chapter 4,.2000).
Versions 4.1, 5.1, and 6.1);
e) The characteristics of the internal ultrafast wavefront overvoltage have been modified, changing the low-frequency range f3 component (0.1MHz~5MHz) to the frequency range f3.
The system operating voltage component (10Hz~55Hz) was added (see 4.2, 4.1 in the.2000 edition);
f) The characteristics of the transient casing voltage were modified, changing the VHF range f1 component (up to 100MHz) to the frequency range f1 component.
The quantity (up to 50MHz) will be adjusted to change the low-frequency range f3 component (0.1MHz~1MHz) to the frequency range f3 component.
(30kHz~1MHz), the amplitude range is modified to 0.01~0.035 times the system's highest operating voltage (see 4.3,.2000 edition).
(5.1)
g) The characteristics of the external ultrafast wavefront overvoltage were modified, changing the low-frequency range f3 component (0.1MHz~5MHz) to the frequency range f3.
The system operating voltage component (10Hz~55Hz) has been added, while the step voltage and very high voltage components have been removed.
The frequency range f1 component (up to 100MHz) was adjusted, and the amplitude range was modified to 1.0 to 2.0 times the system's highest operating voltage (see...).
4.4 (6.1 in the.2000 edition)
h) A chapter on "Measurement System for Ultra-Fast Wavefront Overvoltage" has been added, and relevant content from the.2000 edition has been revised and incorporated (see...).
Chapter 5 (sections 4.2, 4.3, 4.4, 5.2, 5.3, 5.4, 6.2, 6.3, and 6.4 of the.2000 edition).
i) An example of a measurement system for external ultra-fast wavefront overvoltage has been added (see Figures 7-9 in 5.2.1.3);
j) The basic requirements for the measurement system for internal ultra-fast wavefront overvoltage have been increased, with the axial distance between the conversion device and the measured point preferably being 1m.
For requirements within the scope, a new normative reference, GB/T 1985-2023, is added (see 5.2.2.1);
k) The electric field probe scheme in the feasible scheme of the transient casing voltage measurement system has been removed (see 5.3.1 in the.2000 edition);
l) The transfer characteristics of the internal ultrafast wavefront overvoltage measurement system were modified (see 5.3.1, 4.2.3 of the.2000 edition);
m) The transfer characteristics of the measurement system for transient case voltage have been modified (see 5.3.2, 5.2.3 in the.2000 edition);
n) The transfer characteristics of the measurement system for external ultra-fast wavefront overvoltage were modified (see 5.3.3, 6.2.3 of the.2000 edition);
o) The method for determining the transfer characteristics of the measurement system has been changed (see 5.3.4, 4.4.2, 5.4.2 and 6.4.2 in the.2000 edition);
p) The calibration procedure for the internal express wavefront overvoltage measurement system has been modified, and the normative reference GB/T 16927.1 has been added.
And GB/T 16927.2 (see 5.4.1, 4.4.3 of the.2000 edition);
q) The calibration procedure for the transient enclosure voltage measurement system has been modified, and the normative references GB/T 16927.1 and have been added.
GB/T 16927.2 (see 5.4.2, 5.4.3 of the.2000 edition);
r) The calibration procedure for the external express wavefront overvoltage measurement system has been modified, and the normative reference GB/T 16927.1 has been added.
And GB/T 16927.2 (see 5.4.3, 6.4.3 of the.2000 edition);
s) Added "Appendix D (Normative) Method for determining the frequency characteristics of a measurement system based on time-domain characteristics experiment".
Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents.
This document was proposed by the China Electrical Equipment Industry Association.
This document is under the jurisdiction of the National Technical Committee on Standardization of High Voltage Testing Technology and Insulation Coordination (SAC/TC163).
This document was drafted by. Xi'an High Voltage Apparatus Research Institute Co., Ltd., China Electric Power Research Institute Co., Ltd., and Xi'an Jiaotong University.
Tsinghua University, Sichuan Energy Internet Research Institute, East China Electric Power Research Institute Co., Ltd., State Grid Shaanxi Electric Power Co., Ltd. Electric Power Research Institute
Research Institute, State Grid Henan Electric Power Research Institute, Yunnan Power Grid Co., Ltd. Electric Power Research Institute, State Grid Ningxia Electric Power Co., Ltd.
China Electric Power Research Institute Co., Ltd., China Southern Power Grid Science Research Institute Co., Ltd., and China Southern Power Grid Co., Ltd. Ultra-High Voltage Transmission Company
Company, State Grid Hebei Electric Power Research Institute, Guangdong Power Grid Co., Ltd. Guangzhou Power Supply Bureau Electric Power Testing and Research Institute,
State Grid Beijing Electric Power Company, Nanjing NARI Relay Protection & Electrical Co., Ltd., Hubei Huazhong Electric Power Technology Development Co., Ltd., State Grid Xinjiang Electric Power
Power Research Institute of Xi'an Electric Power Co., Ltd., and Xi'an Xi'an Electric High Voltage Bushing Co., Ltd.
The main drafters of this document are. Shen Meng, Li Qiang, Li Wenting, Zhang Xiaoyong, Ding Weidong, Ding Dengwei, Liu Chen, Si Wenrong, Han Yanhua, and Wang Zhenyu.
Tan Xiangyu, Wu Xutao, Zhao Xiaobin, Zhang Changhong, Pang Xianhai, Li Xiao, Wei Tangbin, Zhang Zijing, Zhu Yinjun, Liu Weixin, Chen Xiaodong.
The release history of this document and the document it replaces is as follows.
---First published in.2000 as GB/T 18134.1-2000;
---This is the first revision.
High Voltage Testing Technology. Rapid Wavefront Overvoltage Measurement
1 Scope
This document describes the characteristics of ultrafast wavefront overvoltages and common measurement methods for ultrafast wavefront overvoltages, and specifies the basic requirements of the measurement system.
Requirements, transmission characteristics, and verification procedures.
This document applies to the measurement of ultrafast wavefront overcurrents in gas-insulated, metal-enclosed switchgear caused by operational or internal destructive discharges.
Voltage, especially the following three types of ultra-fast wavefront overvoltage measurement systems.
---Internal ultra-fast wavefront overvoltage;
---Transient case voltage;
---External express wavefront overvoltage.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included.
For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies.
This document.
GB/T 1985-2023 High-voltage AC disconnect switches and grounding switches
GB/T 2900.19-2022 Electrical Engineering Terminology. High Voltage Testing Techniques and Insulation Coordination
GB/T 2900.20-2016 Electrical Terminology. High Voltage Switchgear and Controlgear
GB/T 16927.1 High Voltage Testing Techniques – Part 1.General Definitions and Test Requirements
GB/T 16927.2 High Voltage Testing Techniques – Part 2.Measurement Systems
3 Terms and Definitions
The terms and definitions defined in GB/T 2900.19-2022 and GB/T 2900.20-2016, as well as the following terms and definitions, apply to this document.
3.1
Internal ultra-fast wavefront overvoltage
Ultra-fast wavefront overvoltages occur between the high-voltage conductor and the enclosure inside gas-insulated metal-enclosed switchgear (GIS).
3.2
Transient casing voltage
Ultra-fast wavefront overvoltages occur between the GIS shell and the ground outside the GIS.
3.3
External ultra-fast wavefront overvoltage
Extremely fast wavefront overvoltages appearing on GIS external conductors and equipment.
3.4
Transmission characteristics
The functional relationship between the output and input of the measurement system.
...
