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GB/T 17366: Historical versions
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Microbeam analysis - Electron probe microanalysis - Methods of specimen preparation for minerals and rocks
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| GB/T 17366-1998 | English | 249 |
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Methods of mineral and rock specimen preparation for EPMA
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Basic data
| Standard ID | GB/T 17366-2025 (GB/T17366-2025) |
| Description (Translated English) | Microbeam analysis - Electron probe microanalysis - Methods of specimen preparation for minerals and rocks |
| Sector / Industry | National Standard (Recommended) |
| Classification of Chinese Standard | N53 |
| Classification of International Standard | 71.040.99 |
| Word Count Estimation | 9,991 |
| Date of Issue | 2025-08-29 |
| Date of Implementation | 2026-03-01 |
| Older Standard (superseded by this standard) | GB/T 17366-1998 |
| Issuing agency(ies) | State Administration for Market Regulation; Standardization Administration of China |
GB/T 17366-2025: Microbeam analysis - Electron probe microanalysis - Methods of specimen preparation for minerals and rocks
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ICS 71.040.99
CCSN53
National Standards of the People's Republic of China
Replaces GB/T 17366-1998
Microbeam analysis electron probe microscopy
Methods for preparing mineral and rock samples
Published on 2025-08-29
Implemented on 2026-03-01
State Administration for Market Regulation
The State Administration for Standardization issued a statement.
Table of Contents
Preface III
1.Scope 1
2 Normative References 1
3.Terms and Definitions 1
4.Instruments, Equipment and Materials 1
5.Basic requirements for test specimens 2
6.Sample Preparation Method 2
7.Coating of the sample 3
Reference 4
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents".
Drafting.
This document supersedes GB/T 17366-1998 "Preparation Methods of Samples for Electron Probe Analysis of Minerals and Rocks", and is consistent with GB/T 17366-
Compared to.1998, aside from structural adjustments and editorial changes, the main technical changes are as follows.
a) The "Method Summary" (see Chapter 3 of the.1998 edition) has been removed;
b) Added terms and definitions (see Chapter 3);
c) The requirements for instruments, equipment, and materials have been changed (see Chapter 4, Chapter 4 of the.1998 edition);
d) The labeling for the preparation and analysis locations of block samples, particulate samples, and fine powder samples has been changed (see 6.2–6.5,.1998 edition).
(6.1~6.4 and Chapter 7);
e) The coating on the sample was changed (see Chapter 7, Chapter 8 in the.1998 edition).
Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents.
This document was proposed and is under the jurisdiction of the National Technical Committee on Standardization of Microbeam Analysis (SAC/TC38).
This document was drafted by. Institute of Mineral Resources, Chinese Academy of Geological Sciences; Institute of Geology and Geophysics, Chinese Academy of Sciences; and Nuclear Industry.
Beijing Institute of Geology, Shougang Group Co., Ltd., Guangdong Academy of Sciences Industrial Analysis and Testing Center, Institute of Chemistry, Chinese Academy of Sciences.
The main drafters of this document are. Chen Zhenyu, Mao Qian, Fan Guang, Ju Xinhua, Wu Chaoqun, Wang Yanhua, and Zhou Jianxiong.
This document was first published in.1998, and this is its first revision.
Microbeam analysis electron probe microscopy
Methods for preparing mineral and rock samples
1.Scope
This document describes a general method for preparing samples for electron probe microanalysis of various minerals, rocks, and other geological samples.
This document applies to the preparation of samples for electron probe microanalysis of minerals and rocks.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included.
For references to documents, only the version corresponding to that date applies to this document; for undated references, the latest version (including all amendments) applies.
This document.
GB/T 41074 Powder sample preparation method for microbeam analysis for wave spectroscopy and energy spectroscopy
3.Terms and Definitions
The following terms and definitions apply to this document.
3.1
polished section
The blocky rock or ore sample is cut and ground into a sample of a certain size, polished on one side, and can be observed under a microscope under reflected light.
Note. Light slides are generally suitable for samples containing a large amount of opaque metallic minerals.
3.2
thin section
The blocky rock or ore sample is cut and ground into a sample of a certain size, polished on both sides, and can be observed under a microscope under transmitted and reflected light.
Note. Thin sections are generally suitable for rock samples that are mainly composed of transparent minerals. The grinding thickness is generally 30μm~100μm depending on the needs of microscopic observation.
3.3
sandpolished section; sandpolished mount
The sample is prepared by embedding the particulate sample and then grinding and polishing it.
Note. Sanding sheets are generally used for particle samples of millimeter size and below. Sometimes, irregular block samples of centimeter size are also embedded to make regular sanding sheets.
4.Instruments, equipment and materials
4.1 Instruments and Equipment
4.1.1 Vacuum coating machine.
4.1.2 Ultrasonic cleaning device.
4.1.3 Optical microscope.
4.1.4 Slicer (cutting machine).
4.1.5 Grinding mill.
...
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