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GB/T 17365-2025: Microbeam analysis - Method of preparation for specimens of metal and alloy in electron probe microanalysis
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Std ID	Version	USD	Buy	Deliver [PDF] in	Title (Description)
GB/T 17365-2025	English	199	Add to Cart	3 days [Need to translate]	Microbeam analysis - Method of preparation for specimens of metal and alloy in electron probe microanalysis
GB/T 17365-1998	English	179	Add to Cart	2 days [Need to translate]	Method of preparation for samples of metal and alloy in electron probe microanalysis

GB/T 17365-2025: Microbeam analysis - Method of preparation for specimens of metal and alloy in electron probe microanalysis

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ICS 71.040.99 CCSN53 National Standard of the People's Republic of China Replace GB/T 17365-1998 Microbeam analysis of metals and alloys Electron probe quantitative analysis Sample preparation method Released on 2025-03-28 2025-10-01 Implementation State Administration for Market Regulation The National Standardization Administration issued

Foreword

This document is in accordance with the provisions of GB/T 1.1-2020 "Guidelines for standardization work Part 1.Structure and drafting rules for standardization documents" Drafting. This document replaces GB/T 17365-1998 "Preparation of samples for quantitative analysis of metals and alloys by electron probe microbeam analysis" and Compared with GB/T 17365-1998, in addition to structural adjustments and editorial changes, the main technical changes are as follows. a) The requirements for the sample analysis area have been changed (see Chapter 5, Chapter 4 of the.1998 edition); b) The number of cleaning tools has been changed from one to seven (see 4.2.1,.1998 edition). Chapter 3); c) Added matters needing attention in specimen cutting (see 6.1.1 and 6.2); d) Added methods to avoid rounding of the edges of mounted specimens and methods to be used when analyzing the surface composition of mounted specimens. Conductive measures; added "avoid using coating layers containing the elements of the sample to be tested during evaporation" (see 6.1.2); e) Added "During quantitative analysis, corrosion of the test surface of the sample should be avoided as much as possible" (see 6.1.3); f) Added a new clause. "Particle specimens can be mounted, ground and polished, and tested after coating" (see 6.1.7); g) Added a new clause "Mechanical hot mounting content" (see 6.3.2.3); h) Added "vacuum mounting content" (see 6.3.3); i) Added instructions for mechanical polishing (see 6.4). Please note that some of the contents of this document may involve patents. The issuing organization of this document does not assume the responsibility for identifying patents. This document was proposed and coordinated by the National Microbeam Analysis Standardization Technical Committee (SAC/TC38). This document was drafted by. China Iron and Steel Research Institute Co., Ltd., China Iron and Steel Research Institute NAK Testing Technology Co., Ltd., and China Metal Research Institute of the Chinese Academy of Sciences. Institute, Shandong Provincial Analysis and Testing Center, Guangdong Academy of Sciences Industrial Analysis and Testing Center, Shougang Group Co., Ltd., National Standard (Beijing) Inspection and Certification Co., Ltd. Limited company. The main drafters of this document are. Zhong Zhenqian, Lan Jianglin, He Lianlong, Ding Ning, Wu Chaoqun, Ju Xinhua and Ma Tongda. This document was first published in.1998 and this is the first revision. Microbeam analysis of metals and alloys Electron probe quantitative analysis Sample preparation method

1 Scope

This document describes the preparation of bulk specimens of metals and alloys for electron microprobe analysis. This document applies to standard samples and specimens for quantitative analysis using an electron probe or scanning electron microscope equipped with an energy dispersive spectrometer or a spectrometer. This document is not applicable to the preparation of samples with a particle size less than 5 μm or a thickness less than 4 μm.

2 Normative references

The contents of the following documents constitute the essential clauses of this document through normative references in this document. For referenced documents without a date, only the version corresponding to that date applies to this document; for referenced documents without a date, the latest version (including all amendments) applies to This document. GB/T 4296 Microstructure test method for wrought magnesium alloys GB/T 4930 General technical specifications for standard samples for electron probe analysis GB/T 13298 Metal microstructure inspection methods GB/T 15074 General rules for quantitative analysis by electron probe

3 Terms and definitions

There are no terms or definitions that require definition in this document. 4.Instruments, Equipment and Materials 4.1 Sample preparation and observation equipment 4.1.1 Specimen cutting equipment. 4.1.2 Mounting machine. 4.1.3 Metallographic specimen polishing machine. 4.1.4 Metallographic microscope. 4.2 Auxiliary equipment 4.2.1 Equipment for cleaning samples. one or a combination of the following tools can be used as needed. ultrasonic cleaner, nitrogen purge gun, air Compressors, static eliminators, vacuum cleaners, plasma cleaners, etc. 4.2.2 Balance. 4.2.3 Alcohol lamp and crucible. 4.2.4 Oven. 4.2.5 Vacuum coating machine. ...