Path:
Home >
GB/T >
Page169 > GB/T 15617-2025
Price & Delivery
US$219.00 · In stock · Download in 9 secondsGB/T 15617-2025: Microbeam analysis - Electron probe microanalysis - Quantitative analysis of silicate minerals
Delivery: 9 seconds. True-PDF full-copy in English & invoice will be downloaded + auto-delivered via email. See
step-by-step procedureStatus: Valid
GB/T 15617: Historical versions
| Std ID | Version | USD | Buy | Deliver [PDF] in | Title (Description) |
| GB/T 15617-2025 | English | 219 |
Add to Cart
|
3 days [Need to translate]
|
Microbeam analysis - Electron probe microanalysis - Quantitative analysis of silicate minerals
|
| GB/T 15617-2002 | English | 239 |
Add to Cart
|
3 days [Need to translate]
|
Quantitative analysis of silicate minerals by electron probe microanalysis
|
| GB/T 15617-1995 | English | 199 |
Add to Cart
|
2 days [Need to translate]
|
Qantitative analysis method for silicate minerals by EPMA
|
Click to Preview a similar PDF
Basic data
| Standard ID | GB/T 15617-2025 (GB/T15617-2025) |
| Description (Translated English) | Microbeam analysis - Electron probe microanalysis - Quantitative analysis of silicate minerals |
| Sector / Industry | National Standard (Recommended) |
| Classification of Chinese Standard | N53 |
| Classification of International Standard | 71.040.99 |
| Word Count Estimation | 11,143 |
| Date of Issue | 2025-08-29 |
| Date of Implementation | 2026-03-01 |
| Older Standard (superseded by this standard) | GB/T 15617-2002 |
| Issuing agency(ies) | State Administration for Market Regulation; Standardization Administration of China |
GB/T 15617-2025: Microbeam analysis - Electron probe microanalysis - Quantitative analysis of silicate minerals
---This is an excerpt. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.), auto-downloaded/delivered in 9 seconds, can be purchased online: https://www.ChineseStandard.net/PDF.aspx/GBT15617-2025
ICS 71.040.99
CCSN53
National Standards of the People's Republic of China
Replaces GB/T 15617-2002
Microbeam analysis electron probe microscopy
Quantitative analysis of silicate minerals
Published on 2025-08-29
Implemented on 2026-03-01
State Administration for Market Regulation
The State Administration for Standardization issued a statement.
Table of Contents
Preface III
Introduction IV
1.Scope 1
2 Normative References 1
3.Terms and Definitions 1
4.Instruments and Auxiliary Equipment 1
5 Standard Samples/Standard Substances 1
6 Sample 2
7.Measurement Conditions 2
8.Analysis Steps 3
9.Tolerance 4
10 Analysis Results Report 5
Foreword
This document complies with the provisions of GB/T 1.1-2020 "Standardization Work Guidelines Part 1.Structure and Drafting Rules of Standardization Documents".
Drafting.
This document replaces GB/T 15617-2002 "Quantitative Analysis Method of Silicate Minerals by Electron Probe", and is consistent with GB/T 15617-2002.
Apart from structural adjustments and editorial changes, the main technical changes are as follows.
a) The terminology has been removed (see Chapter 3 of the.2002 edition);
b) The selection criteria for standard samples have been changed (see 5.1,.2002 edition of 5.1);
c) The sample preparation process has been modified (see 6.1,.2002 edition 6.1);
d) The requirements for the particle size of the minerals to be analyzed have been increased (see 6.2.2);
e) The content of the sample coating has been changed (see 6.3,.2002 edition of 6.3);
f) Added measures to handle situations where interference cannot be avoided when analyzing spectral lines (see 7.4.2);
g) The content of the counting time has been changed (see 7.5,.2002 version 7.5);
h) Added a note on peak-fixing mode (see 7.6, 6.3 in the.2002 edition);
i) The requirements for selecting the backing position have been changed (see 7.7,.2002 version 7.7);
j) Added the option to select the valence state of elements (see 7.8);
k) Increased error requirements for monitoring standard sample analysis (see 8.4.2);
l) Requirements for data quality assessment of quantitative analysis results have been added (see 8.4.5);
m) Quantitative analysis of special minerals has been added (see 8.4.6);
n) The correction calculations for the results have been removed (see Chapter 9 of the.2002 edition);
o) Increased requirements for analytical accuracy (see 9.2);
p) The requirement that "the quantitative value of a given quantitative element shall not be less than the absolute error 2σ" has been removed (see 10.3 of the.2002 edition).
Please note that some content in this document may involve patents. The issuing organization of this document assumes no responsibility for identifying patents.
This document was proposed and is under the jurisdiction of the National Technical Committee on Standardization of Microbeam Analysis (SAC/TC38).
This document was drafted by. Institute of Mineral Resources, Chinese Academy of Geological Sciences; Beijing Research Institute of Geology, Nuclear Industry; and Institute of Geology and Geophysics, Chinese Academy of Sciences.
Institute of Geophysics, Guangdong Academy of Sciences Industrial Analysis and Testing Center, Shougang Group Co., Ltd., and Institute of Chemistry, Chinese Academy of Sciences.
The main drafters of this document are. Chen Zhenyu, Fan Guang, Mao Qian, Wu Chaoqun, Ju Xinhua, Wang Yanhua, and Zhou Jianxiong.
This document was first published in.1995, revised for the first time in.2002, and this is the second revision.
introduction
Silicate minerals are widely distributed in various geological formations, and accurate quantitative analysis of their elemental content is crucial in Earth sciences. (Electronics)
Probe analysis is a primary method for in-situ quantitative analysis of the composition of silicate minerals in micro-areas. However, silicate minerals are diverse, and some silicate minerals...
Salt minerals may contain high mass fractions of water, or contain ultralight elements that are difficult to analyze directly, or contain substances that are prone to oxidation under electron beam bombardment.
Migrating elements make accurate results difficult to obtain in electron probe microanalysis of some silicate minerals. Therefore, it is necessary to formulate silicate...
Standards for electron probe microanalysis of mineral components, including working conditions, analytical procedures, and reference materials in electron probe microanalysis of silicate minerals.
Standardize the quality, etc.
Microbeam analysis electron probe microscopy
Quantitative analysis of silicate minerals
1.Scope
This document describes an electron probe microanalysis method for the quantitative analysis of stable natural silicate minerals under electron beam conditions.
This document applies to natural silicate minerals, as well as synthetic silicate materials and other oxygen-containing salts, such as phosphates and sulfates.
And so on, as well as oxide minerals and materials.
This document applies to quantitative analysis using electron probe microanalysis, and also to quantitative analysis using scanning electron microscopes equipped with a spectrometer.
analyze.
2 Normative references
The contents of the following documents, through normative references within the text, constitute essential provisions of this document. Dated citations are not included.
For references to this document, only the version corresponding to that date applies. For undated references, the latest version (including all amendments) applies.
This document.
GB/T 4930 Technical Specifications for Standard Samples for Electron Probe Microscopy Analysis
GB/T 15074 General Rules for Electron Probe Quantitative Analysis
GB/T 17366 Preparation of Samples for Electron Probe Analysis of Minerals and Rocks
GB/T 20725 Guidelines for Qualitative Point Analysis by Electron Probe Microscopy in Spectroscopy
GB/T 21636 Electron Probe Microscopy (EPMA) Terminology
GB/T 43889 Guidelines for the Implementation of Quality Assurance Procedures for Electron Probe Microscopes (EPMA)
3.Terms and Definitions
The terms and definitions defined in GB/T 21636 and GB/T 43889 apply to this document.
4.Instruments and auxiliary equipment
The instruments and auxiliary equipment are as follows.
---Electron probe microanalyzer or scanning electron microscope with X-ray spectrometer;
---Sample grinding and polishing machines;
---Vacuum spray coating equipment;
---Ultrasonic cleaner;
---Polarizing microscope.
5.Standard samples/standard substances
5.1 Principles for Selecting Standard Samples
5.1.1 Standard samples/standard substances (also known as certified reference materials or standards) should be selected. If no suitable standard samples/standard substances are available, follow the guidelines.
...
