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GA/T 1171-2014 PDF English

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GA/T 1171-2014: Examination methods for similarity comparison of integrated circuit chips
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Basic data

Standard ID GA/T 1171-2014 (GA/T1171-2014)
Description (Translated English) Examination methods for similarity comparison of integrated circuit chips
Sector / Industry Public Security (Police) Industry Standard (Recommended)
Classification of Chinese Standard L56
Classification of International Standard 31.200
Word Count Estimation 5,590
Quoted Standard GA/T 756-2008; GA/T 976-2012
Regulation (derived from) Notice on Publication of Public Safety Industry Standard (Year of 2014); Industry Standard Record Announcement No. 4 of 2015 (No. 184)
Issuing agency(ies) Ministry of Public Security
Summary This standard specifies the test method for the similarity comparison of integrated circuits. This standard applies to the similarity comparison of integrated circuit chips to test the similarity of integrated circuit chip design.

GA/T 1171-2014: Examination methods for similarity comparison of integrated circuit chips


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Examination methods for similarity comparison of integrated circuit chips ICS 31.200 L56 People's Republic of China Public Security Industry Standards Chip similarity comparison test method 2014-07-09 release 2014-07-09 implementation People's Republic of China Ministry of Public Security

Foreword

This standard was drafted in accordance with GB/T 1.1-2009 given rules. This standard was proposed by the Ministry of Public Security the third Institute. This standard is under the jurisdiction of the Ministry of Public Security Information System Standardization Technical Committee. This standard was drafted. MPS Third Institute. The main drafters of this standard. crystal sand, Jinbo, Hang Wei Qiang, Cai Liming, Xu Jun. Chip similarity comparison test method

1 Scope

This standard specifies the IC chip similarity comparison test. This standard applies to the integrated circuit chip similarity comparison, a similar test integrated circuit chip design.

2 Normative references

The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein Member. For undated references, the latest edition (including any amendments) applies to this document. GA/T 756-2008 digitizer evidence data discovery extraction method of fixing GA/T 976-2012 electronic data forensic identification General procedure

3 Terms and Definitions

GA/T 756-2008 and GA/T 976-2012 defined by the following terms and definitions apply to this document. 3.1 RTL code (register transfer level code) RTLcode (registertransferlevelcode) Logic circuit description, general hardware description language. 3.2 Netlist netlist Netlist is a logical unit and the interconnection between their data file description. 3.3 Layout layout Door level netlist converted to form a physical representation of the silicon layer structure geometry. 3.4 Circuit diagram schematics Circuit connection diagram electrical symbols, also known as a circuit diagram.

4 Equipment

4.1 Hardware Storage media to preserve a backup device, test the required hardware environment. 4.2 Software Inspection required software tools, such file comparison tools. ...

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