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SN/T 3348-2012: Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry
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| Standard ID | Contents [version] | USD | STEP2 | [PDF] delivered in | Standard Title (Description) | Status | PDF |
| SN/T 3348-2012 | English | 189 |
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Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry
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SN/T 3348-2012
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Basic data | Standard ID | SN/T 3348-2012 (SN/T3348-2012) | | Description (Translated English) | Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry | | Sector / Industry | Commodity Inspection Standard (Recommended) | | Classification of Chinese Standard | H40 | | Classification of International Standard | 77.140.20 | | Word Count Estimation | 7,747 | | Quoted Standard | GB/T 1031; GB/T 16597 | | Regulation (derived from) | National Quality Inspection (2012) 777; industry standard filing Notice 2013 No. 4 (No. 160 overall) | | Issuing agency(ies) | General Administration of Customs | | Summary | This standard specifies the chrome-nickel steel, tungsten, silicon, manganese, phosphorus, chromium, nickel, tungsten content of wavelength dispersive X-ray fluorescence spectrometric method. This standard applies to chrome-nickel steel, tungsten silicon, | SN/T 3348-2012: Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel. Wave-length dispersive X-ray fluorescence spectrometry
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Determination of silicon, manganese, phosphorus, chromium, nickel and tungsten in chrome-nickel-tungsten steel.Wave-length dispersive X-ray fluorescence spectrometry
People's Republic of China Entry-Exit Inspection and Quarantine Standards
Determination of chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content
Wavelength dispersive X-ray fluorescence spectrometry
Determinationofsilicon, manganese, phosphorus, chromium, nickelandtungsten
Issued on. 2012-12-12
2013-07-01 implementation
People's Republic of China
The State Administration of Quality Supervision, Inspection and Quarantine released
Foreword
This standard was drafted in accordance with GB/T 1.1-2009 given rules.
This standard is proposed and managed by the National Certification and Accreditation Administration Committee.
This standard was drafted. People's Republic of China Shandong CIQ.
The main drafters of this standard. WANG Zhao Kun, Cai hair, Qi Jialin, Liu Jingjie, Xu Ming, Li Yan Qiu, Wang Chonglin.
Determination of chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content
Wavelength dispersive X-ray fluorescence spectrometry
1 Scope
This standard specifies the chromium-nickel steel tungsten silicon, manganese, phosphorus, chromium, nickel, tungsten content of wavelength dispersive X-ray fluorescence spectrometric method.
This standard applies to the determination of chromium nickel-tungsten steel silicon, manganese, phosphorus, chromium, nickel, tungsten content in the measurement range shown in Table 1.
Table 1 Measuring range% (mass fraction)
Element measurement range measurement range of elements
Silicon 0.069 to 0.41
Manganese 0.23 to 0.62
P 0.010 to 0.048
Chromium 0.30 to 1.93
Nickel 1.09 ~ 6.93
Tungsten, 0.60 to 1.60
2 Normative references
The following documents for the application of this document is essential. For dated references, only the dated version suitable for use herein
Member. For undated references, the latest edition (including any amendments) applies to this document.
GB/T 1031 surface roughness parameters and their values
GB/T 16597 metallurgical product analysis X-ray Fluorescence Spectrometry General
3 Method summary
Analysis of the sample surface processed into a smooth plane, at selected measuring instrument conditions, measure the X-ray characteristics of the analyte in the sample spectrum
Ray fluorescence intensity, according to the quantitative relationship between X-ray fluorescence intensity between the analyte content, calculate the amount of analyte.
4 Reagents and materials
4.1 detector gas (P10). 90% argon, 10% methane for gas-flow proportional counter.
4.2 Standard sample. Spectroscopy using standard test block. Each element should be at least six standard samples, the content should be a certain interval, and covers the test element
Pigment measurement range.
5 Instruments
5.1 wavelength dispersive X-ray fluorescence spectrometer, in line with GB/T 16597 regulations.
5.2 lathe, milling machine, planer, or other non-polluting metallographic sandpaper surface processing equipment.
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