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SJZ11352-2006 English PDF

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SJ/Z 11352-2006English1519 Add to Cart 6 days [Need to translate] Integrated circuit IP core test data interchange formats and guidelines specification Obsolete SJ/Z 11352-2006

PDF similar to SJZ11352-2006


Standard similar to SJZ11352-2006

GB/T 43770   SJ/T 11460.6.4   GB/T 35010.6   SJ 21634   SJ 21635   SJ 21619   

Basic data

Standard ID SJ/Z 11352-2006 (SJ/Z11352-2006)
Description (Translated English) Integrated circuit IP core test data interchange formats and guidelines specification
Sector / Industry Electronics Industry Standard
Classification of Chinese Standard L56
Classification of International Standard 31.200
Word Count Estimation 38,334
Date of Issue 2006-09-26
Date of Implementation 2006-12-01
Regulation (derived from) Industry Standard Notice 2006 No. 11 (No. 83 overall)
Issuing agency(ies) Ministry of Industry and Information Technology
Summary This standard specifies the IP providers and IP integration to pass information between the parties and the nature of the format. The specification for the integrated circuit IP cores (Intellectual Property Core, hereinafter referred to as IP) provider has developed test data exchange formats and design for testability (DFT, Design-for-Test) guidelines. In addition, the specification also provides IP providers to develop some guidelines to ensure that IP can be used for SoC designs. Data format for the IP range covers IC create, define, describe switching and integrated.