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JJG 629-2014

Chinese Standard: 'JJG 629-2014'
Standard IDContents [version]USDSTEP2[PDF] delivered inStandard Title (Description)StatusRelated Standard
JJG 629-2014English459 Add to Cart Days<=4 Verification Regulation for Polycrystalline X-ray Diffractometers Valid JJG 629-2014
JJG 629-2014Chinese18 Add to Cart <=1-day [PDF from Chinese Authority, or Standard Committee, or Publishing House]

   

BASIC DATA
Standard ID JJG 629-2014 (JJG629-2014)
Description (Translated English) Verification Regulation for Polycrystalline X-ray Diffractometers
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A61
Classification of International Standard 17.020
Word Count Estimation 20,279
Date of Issue 2014/6/15
Date of Implementation 2014/12/15
Older Standard (superseded by this standard) JJG 629-1989
Quoted Standard GBZ 115-2010; JB/T 9400-2010
Drafting Organization Shanghai Institute of Measurement and Testing
Administrative Organization National Technical Committee on Environment stoichiometric
Regulation (derived from) The State Administration of Quality Supervision, Inspection and Quarantine Notice No. 64 of 2014
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This Standard specifies the multi-crystal X-ray diffraction (hereinafter referred to as the instrument) the initial verification, verification and subsequent use of checks.

JJG 629-2014
Verification Regulation for Polycrystalline X-ray Diffractometers
State verification procedures People's Republic of China
Multi-crystal X-ray diffractometer
Issued on. 2014-06-15
2014-12-15 implementation
The State Administration of Quality Supervision, Inspection and Quarantine released
Multi-crystal X-ray diffractometer
Verification Regulation
Diffractometers
Replacing JJG 629-1989
Focal point. the National Technical Committee on Environment stoichiometry
Main drafting unit. Shanghai Institute of Measurement and Testing
Participated in the drafting. Dandong City Institute of Measurement and Testing Technology
This procedure commissioned the National Technical Committee of the stoichiometric environment responsible for interpreting
The main drafters of this procedure.
Gongfei Yan (Shanghai Institute of Measurement and Testing)
Chai Guanghui (Institute of Measurement and Testing Technology Dandong City)
Ding Min (Shanghai Institute of Measurement and Testing)
Drafters participate.
Yang Peili (Institute of Measurement and Testing Technology Dandong City)
Chan Wing-hong (Shanghai Institute of Measurement and Testing)
table of Contents
Introduction (Ⅱ)
1 Scope (1)
2. References (1)
3 Overview (1)
4 metering performance requirements (2)
4.1 Instrument 2θ angle indication error (2)
4.2 Instrument 2θ angle Repeatability (2)
4.3 Instrument Resolution (2)
4.4 detector spectrum resolution (2)
4.5 Stability diffraction intensity (2)
5 General Requirements (2)
5.1 Appearance (2)
5.2 safety indicators (2)
6 Control of measuring instruments (3)
6.1 Verification condition (3)
6.2 Verification Project (3)
6.3 Verification Methods (4)
6.4 test results processing and verification cycle (7)
Appendix A multi-crystal X-ray diffraction test original records (for reference) (8)
Appendix B test certificates/test results in the notice page and format (11)
Appendix C of the standard reference material verification diffraction angle (14)
introduction
This procedure is JJG 629-1989 "multi-crystal X-ray diffractometer" revision. The preparation of the procedures reference
GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards", JB/T 9400-2010 "X shoot
Ray diffraction instrument technical conditions. " Compared with JJG 629-1989, in addition to editorial changes outside the main technical changes are as follows.
--- Abolished the old statutes theodolite and altimeter using only standard materials instrument 2θ angle indication error
Difference for examination.
--- Remove the original protocol verification project "tube voltage and current stability."
--- Canceled instrument rating.
--- Reference JB/T 9400-2010 "X-ray diffraction technology", when the diffraction intensity stability test
Room to 8h.
--- Original statutes test project "X-ray scattering dose" was renamed "scattered radiation leakage air kerma rate"
Technical indicators and methods reference GB Z115-2010 "X-ray diffraction and fluorescence analyzer health protection standards."
The previous versions of the release JJG 629 case.
JJG 629-1989.
Multi-crystal X-ray diffraction test procedures
1 Scope
The order applies to multi-crystal X-ray diffraction (hereinafter referred to as equipment) initial verification, use and subsequent verification
Check.
2. References
This procedure references the following documents.
GB Z115-2010 X-ray diffraction and fluorescence analyzer health protection standards
JB/T 9400-2010 X-ray diffraction technique condition
For dated references, only the dated edition applies to this procedure; undated reference documents
Member, the latest edition (including any amendments) applies to this procedure.
3 Overview
Multi-crystal X-ray diffractometer with a particle detector to detect and record the X-ray generator diffraction on polycrystalline aggregates
Sophisticated analytical instruments. Instrument by measuring the diffraction angle, combined with quantum chemical calculations, measurements of crystal powder substance
Structure, lattice constants, phase composition and other structural parameters.
The basic principles of instrumentation is based on Bragg equation, the equation is given by equation (1).
2d (hkl) sinθ = nλ (1)
Where.
d (hkl) --- spacing, nm;
θ --- diffraction angle, (°);
n --- diffraction orders;
λ --- X-ray wavelength, nm.
Where h, k, l is an integer of three prime, it represents the crystal plane index. λ depends on the female X-ray tube used
Pole (target) of metallic materials.
The basic structure of multi-crystal X-ray diffraction is shown in Fig.
Related standard:   JJG 631-2013  JJG 657-2019
Related PDF sample:   JJG 631-2013  JJG 714-2012
   
 
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