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JJF 1601-2016 English PDF

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JJF 1601-2016: Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
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Basic data

Standard ID JJF 1601-2016 (JJF1601-2016)
Description (Translated English) Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard A60
Word Count Estimation 19,118
Date of Issue 2016-11-30
Date of Implementation 2017-02-28
Regulation (derived from) State Administration of Quality Supervision, Inspection and Quarantine Notice No.119 of 2016
Issuing agency(ies) General Administration of Quality Supervision, Inspection and Quarantine

JJF 1601-2016: Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement


---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Spectrophotometers for Diffuse Reflectance Measurement National Metrological Technical Code of the People's Republic of China Standard for Calibration of Diffuse Reflectance Spectrometer 2016-11-30 release 2017-02-28 Implementation State Administration of Quality Supervision, Inspection and Quarantine issued Standard for Calibration of Diffuse Reflectance Spectrometer Spectrophotometers forDiffuse Coordinate unit. National Committee for Optical Metrology The main drafting unit. China Institute of Metrology Guangdong Institute of Metrology Shanghai Institute of Metrology and Testing Technology Participated in the drafting unit. Institute of Building Physics, China Academy of Building Research This specification entrusts the National Committee for Optical Metrology to explain The main drafters of this specification. Zhang qiao-xiang (China Institute of Metrology) Weight xiaojing (Guangdong Institute of Metrology) Ye Junan (Shanghai Institute of Metrology and Testing Technology) Participate in the drafters. Zhang jianping (Institute of Building Physics, China Academy of Building Research) Zheng Chundi (China Institute of Metrology) Liu Zilong (China Institute of Metrology)

table of Contents

Introduction (II) 1 Scope (1) 2 References (1) 3 terms and units of measurement (1) 4 Overview (1) 5 Metrological characteristics (2) 5.1 Appearance of Spectrometer (2) 5.2 Metrological characteristics of spectrometer (3) 6 Calibration conditions (3) 6.1 Calibration of environmental conditions (3) 6.2 Calibration equipment or measurement standards (3) 7 Calibration items and calibration methods (4) 7.1 Wavelength indication error and wavelength repeatability (4) 7.2 Noise and drift (5) 7.3 Spectral Bandwidth (6) 7.4 Reflectance ratio/reflection factor Indication error and measurement repeatability (6) 8 Calibration results (7) 9 Recurrence interval (7) Appendix A Spectrometer Calibration Original Record Recommended Format (8) Appendix B Calibration Certificate Page Format Recommended Format (9) Appendix C Diffuse Reflectance Ratio Indication Error Correction Example of Calibration Uncertainty (10) Appendix D-1 Reference wavelength of the wavelength standard (13) Appendix D-2 Reference wavelength of the wavelength standard (14)

Introduction

JJF 1032-2005 "Terminology and definitions of optical radiation metrology terms", JJF 1071-2010 "National metrological calibration Normative writing rules ", JJF 1059.1-2012" measurement uncertainty assessment and representation "together constitute the support of this specification Formulate the basic series of norms. This specification is the first release. Standard for Calibration of Diffuse Reflectance Spectrometer

1 Scope

This specification is applicable to spectrometers for diffuse reflection measurements at wavelengths from 250 nm to 2500 nm (see below) Called spectrometer).

2 reference file

Standard Practice for Calibration of Spectral Photometer Standard Filters JJG1034-2008 Evaluation and Representation of Measurement Uncertainty JJF 1059.1-2012 GB/T 3978 standard lighting body and geometric conditions For dated references, only the dated edition applies to this specification; references that are not dated , The latest version (including all modifications) applies to this specification.

3 terms and units of measurement

3.1 spectral reflectance ratio Spectral reflectance refers to the reflected radiation in the spectral composition, polarization state and geometric distribution under the specified conditions, the reflection of The ratio of the spectral flux to the incident spectral flux. Its symbol is ρ, in units of 1. 3.2 spectral reflectance factor In the spectral composition of the incident radiation, polarization state and geometric distribution under the specified conditions, the measured reflector in the specified circle The spectral flux reflected in the direction defined by the cone is the same as the ideal diffuse reflector in the same direction (or lighting) The ratio of the reflected spectral flux. Its symbol is R, in units of 1. Note. A mirror reflector that is illuminated (or illuminated) by a small solid angle beam, if the given cone contains the mirror reflection of the source Like, the reflection factor may be much greater than 1. If the solid angle of the cone is close to 2πsr, the reflection factor is close to the reflection ratio under the same lighting conditions; if the circle When the cone angle is close to zero, the reflection factor is close to the radiance (or brightness) factor under the same lighting conditions. 3.3 noise Refers to the instrument in the target signal other than all other signals in general, for the spectrometer, the general two kinds of noise Sound. full noise and background noise. Drift drift Refers to the amount of change in the instrument's baseline over time.

4 Overview

Spectrometers for diffuse reflection measurements are based on the molecules of the substance on the ultraviolet, visible, near-infrared (Light) selective absorption, and by comparing the measured reflectance ratio of the standard plate to achieve spectral diffuse reflection of the phase An optical instrument that measures the material properties to achieve measurement. Spectrometer mainly by the light source, monochromator, reflective accessories, sample room, detector, signal processing system and display

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