JJF 1120-2004

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JJF 1120-2004	English	419	Add to Cart	3 days	Calibration specification for thermal ionization isotope mass spectrometers	JJF 1120-2004	Valid	JJF 1120-2004

JJF 1120-2004
Calibration specification for thermal ionization isotope mass spectrometers
National Metrology Technical Specification of the People's Republic
Thermal ionization isotope mass spectrometer calibration specification
Released on June.2004
2004-09-01 implementation
The General Administration of Quality Supervision, Inspection and Quarantine issued
Thermal ionization isotope mass spectrometer calibration specification
Ectrometers
This specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on June 4,.2004, and
Implemented on September 1,.2004.
Focal Point. National Physical and Chemical Measurement Technical Committee
Drafting unit. National Standards Research Center
This specification is interpreted by the focal point
Drafters of this specification.
Zhao Motian (National Reference Materials Research Center)
Wang Jun (National Reference Materials Research Center)
Bohai (National Reference Materials Research Center)
table of Contents
1 range (1)
2 Citations (1)
3 terms and units of measurement (1)
3.1 Isotope abundance (1)
3.2 Isotope abundance ratio (1)
3.3 Quality range (1)
3.4 resolution (1)
3.5 Peak shape factor (1)
3.6 System Stability (1)
3.7 Sensitivity (ion yield) (1)
3.8 Abundance sensitivity (2)
3.9 Measurement repeatability (2)
3.10 Fractionation effect (2)
3.11 Quality Discrimination (2)
3.12 Memory Effect (2)
4 Overview (2)
5 Measurement characteristics (2)
6 Calibration conditions (3)
6.1 Laboratory Environment (3)
6.2 Calibration Equipment (3)
6.3 Isotope Reference Materials (3)
6.4 Inspection and adjustment of calibration objects (3)
7 Calibration items and calibration methods (4)
7.1 Resolution Calibration (4)
7.2 Sensitivity calibration (5)
7.3 Abundance sensitivity calibration (5)
7.4 Peak shape coefficient calibration (5)
7.5 System Stability Calibration (6)
7.6 Internal Repeatability Calibration (6)
7.7 External Repeatability Calibration (7)
8 Expression of calibration results (8)
9 re-study interval (8)
Appendix A Calibration Record Format (9)
Appendix B Thermal Ionization Isotope Mass Spectrometer Calibration Certificate Format (11)
Thermal ionization isotope mass spectrometer calibration specification
1 Scope
This specification applies to the calibration of various types of thermal ionization isotope mass spectrometers (hereinafter referred to as mass spectrometers).
2 Citations
JJF 1001-1998 General measurement terms and definitions
JJF 1059-1999 Measurement Uncertainty Evaluation and Representation
GB/T 15481-2000 General requirements for testing and calibration laboratory capabilities
Use of this specification should be done with the current valid version of the above cited documents.
3 terms and units of measure
3.1 Isotope abundance
The atomic share of the various isotopes possessed by an element in the element. Isotope abundance representation
There are. (1) atomic fraction. the number of moles of a certain stable isotope and the total number of moles of the element
Ratio; (2) atomic percentage. the atomic fraction expressed in percentage.
3.2 Isotope abundance ratio
The ratio of the isotopic abundance of an element to the other isotopic abundance of that element.
3.3 Quality range
The mass range represents the interval from the smallest to the largest mass of the sample that can be measured by the mass spectrometer. The unit is the atomic mass list.
Bit u.
3.4 resolution
Resolution Characterization The ability of a mass spectrometer to identify two adjacent mass ion beams, defined as being within the mass range of the mass spectrometer
The degree to which a particular mass M position is separated from the two ion beams at the M ΔM position and expressed in M/ΔM
The resolution of the meter. Dimensionless.
3.5 peak shape factor
The peak shape factor characterizes the ion beam imaging characteristics, it is associated with the entrance and exit slits of the mass spectrometer, and the ion optics field shape <