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JJF 1092-2002 English PDF

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JJF 1092-2002: Calibration Specification for Light. Section Microscopes
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JJF 1092-2002English369 Add to Cart 3 days [Need to translate] Calibration Specification for Light. Section Microscopes Valid JJF 1092-2002

PDF similar to JJF 1092-2002


Standard similar to JJF 1092-2002

GB/T 22062   GB/T 2985   JY/T 011   JJG 1092   

Basic data

Standard ID JJF 1092-2002 (JJF1092-2002)
Description (Translated English) Calibration Specification for Light. Section Microscopes
Sector / Industry Metrology & Measurement Industry Standard
Classification of Chinese Standard N32;A60
Word Count Estimation 14,189
Date of Issue 2002-11-04
Date of Implementation 2003-05-04
Older Standard (superseded by this standard) JJG 76-1980
Quoted Standard JJF 1001-1998; JJF 1059-1999; GB/T 1031-1995
Issuing agency(ies) State Administration of Quality Supervision, Inspection and Quarantine
Summary This standard applies to light cut microscope calibration.

JJF 1092-2002: Calibration Specification for Light. Section Microscopes

---This is a DRAFT version for illustration, not a final translation. Full copy of true-PDF in English version (including equations, symbols, images, flow-chart, tables, and figures etc.) will be manually/carefully translated upon your order.
Calibration Specification for Light.Section Microscopes National Metrology Technical Specification of the People's Republic Light-cut microscope calibration specification Released on November 11,.2002 Implementation of.2003-05-04 The General Administration of Quality Supervision, Inspection and Quarantine issued Replace JJG76-1980 This calibration specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on November 4,.2002. It will be implemented as of May 4,.2003. Focal Point. National Geometric Quantity Engineering Measurement Technology Committee Main drafting unit. Guangxi Institute of Metrology and Testing Shaanxi Institute of Metrology and Testing Shanghai Institute of Optical Instruments This specification entrusts the focal point to be responsible for interpretation The main drafters of this specification. Quan Zhizhi (Guangxi Metrology and Testing Institute) Zhang Lei (Shaanxi Institute of Metrology and Testing) Zhang Xingde (Shanghai Institute of Optical Instruments)

table of Contents

1 Scope (1) 2 Citations (1) 3 Overview (1) 4 Measurement characteristics (1) 4.1 Measuring microscopic eyepiece field of view and indication error (1) 4.2 Straightness and parallelism of the slit like two edges (2) 4.3 Parallelism of the moving plane of the table and the horizontal plane to the surface of the table (2) 4.4 The curvature of the slit image in the vertical direction (2) 4.5 The displacement of the object image caused by the 20N lateral force of the bracket (2) 4.6 Instrument indication error (2) 5 Calibration conditions (3) 5.1 Environmental conditions (3) 5.2 Measuring Standards and Other Equipment (3) 6 Calibration items and calibration methods (3) 6.1 Measuring microscopic eyepiece field of view and indication error (3) 6.2 Straightness and parallelism of the slit like two edges (4) 6.3 Parallelism of the moving plane of the table and the horizontal plane to the surface of the table (4) 6.4 The curvature of the slit image in the vertical direction (4) 6.5 Displacement of the object image caused by the 20N lateral force of the bracket (4) 6.6 Instrument indication error (4) 7 Expression of calibration results (6) 8 re-study interval (6) Appendix A Evaluation of Measurement Uncertainty of Instrument Indication Error Calibration Results (7) Appendix B Calibration Certificate Contents (9) Light-cut microscope calibration specification

1 Scope

This specification applies to the calibration of light-cut microscopes.

2 Citations

This specification refers to the following documents. JJF 1001-1998 General measurement terms and definitions JJF 1059-1999 Measurement Uncertainty Evaluation and Representation GB/T 1031-1995 Surface roughness parameters and their values Use of this specification should be done with the current valid version of the above cited documents.

3 Overview

The shape of the light-cutting microscope is shown in Figure 1. It measures the surface roughness by the principle of light-cutting measurement (Fig. 2). Contour peak height and valley depth, the measurement range (1.0~80) μm. figure 1

4 Measurement characteristics

4.1 Measuring microscopic eyepiece field of view and indication error When the micrometer eyepiece drum indicates the zero position, the millimeter line of the micrometer eyepiece reticle shall be placed in the double scribe line index. In the field of view of the instrument, the image of the slit image and the object to be measured should be clearly adjusted at the same time, and in the center of the field of view, it is clear

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