JJF 1092-2002_English: PDF (JJF1092-2002)
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Calibration Specification for Light. Section Microscopes
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JJF 1092-2002
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JJF 1092-2002
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| Standard ID | JJF 1092-2002 (JJF1092-2002) | | Description (Translated English) | Calibration Specification for Light. Section Microscopes | | Sector / Industry | Metrology & Measurement Industry Standard | | Classification of Chinese Standard | N32;A60 | | Word Count Estimation | 14,126 | | Date of Issue | 2002-11-04 | | Date of Implementation | 2003-05-04 | | Older Standard (superseded by this standard) | JJG 76-1980 | | Quoted Standard | JJF 1001-1998; JJF 1059-1999; GB/T 1031-1995 | | Drafting Organization | Guangxi Institute of Measurement and Testing | | Administrative Organization | National Engineering geometric parameters measured Technical Committee | | Issuing agency(ies) | State Administration of Quality Supervision, Inspection and Quarantine | | Summary | This standard applies to light cut microscope calibration. | JJF 1092-2002
Calibration Specification for Light.Section Microscopes
National Metrology Technical Specification of the People's Republic
Light-cut microscope calibration specification
Released on November 11,.2002
Implementation of.2003-05-04
The General Administration of Quality Supervision, Inspection and Quarantine issued
Replace JJG76-1980
This calibration specification was approved by the General Administration of Quality Supervision, Inspection and Quarantine on November 4,.2002.
It will be implemented as of May 4,.2003.
Focal Point. National Geometric Quantity Engineering Measurement Technology Committee
Main drafting unit. Guangxi Institute of Metrology and Testing
Shaanxi Institute of Metrology and Testing
Shanghai Institute of Optical Instruments
This specification entrusts the focal point to be responsible for interpretation
The main drafters of this specification.
Quan Zhizhi (Guangxi Metrology and Testing Institute)
Zhang Lei (Shaanxi Institute of Metrology and Testing)
Zhang Xingde (Shanghai Institute of Optical Instruments)
table of Contents
1 range (1)
2 Citations (1)
3 Overview (1)
4 Measurement characteristics (1)
4.1 Measuring microscopic eyepiece field of view and indication error (1)
4.2 Straightness and parallelism of the slit like two edges (2)
4.3 Parallelism of the moving plane of the table and the horizontal plane to the surface of the table (2)
4.4 The curvature of the slit image in the vertical direction (2)
4.5 The displacement of the object image caused by the 20N lateral force of the bracket (2)
4.6 Instrument indication error (2)
5 Calibration conditions (3)
5.1 Environmental conditions (3)
5.2 Measuring Standards and Other Equipment (3)
6 Calibration items and calibration methods (3)
6.1 Measuring microscopic eyepiece field of view and indication error (3)
6.2 Straightness and parallelism of the slit like two edges (4)
6.3 Parallelism of the moving plane of the table and the horizontal plane to the surface of the table (4)
6.4 The curvature of the slit image in the vertical direction (4)
6.5 Displacement of the object image caused by the 20N lateral force of the bracket (4)
6.6 Instrument indication error (4)
7 Expression of calibration results (6)
8 re-study interval (6)
Appendix A Evaluation of Measurement Uncertainty of Instrument Indication Error Calibration Results (7)
Appendix B Calibration Certificate Contents (9)
Light-cut microscope calibration specification
1 Scope
This specification applies to the calibration of light-cut microscopes.
2 Citations
This specification refers to the following documents.
JJF 1001-1998 General measurement terms and definitions
JJF 1059-1999 Measurement Uncertainty Evaluation and Representation
GB/T 1031-1995 Surface roughness parameters and their values
Use of this specification should be done with the current valid version of the above cited documents.
3 Overview
The shape of the light-cutting microscope is shown in Figure 1. It measures the surface roughness by the principle of light-cutting measurement (Fig. 2).
Contour peak height and valley depth, the measurement range (1.0~80) μm.
figure 1
4 Measurement characteristics
4.1 Measuring microscopic eyepiece field of view and indication error
When the micrometer eyepiece drum indicates the zero position, the millimeter line of the micrometer eyepiece reticle shall be placed in the double scribe line index.
In the field of view of the instrument, the image of the slit image and the object to be measured should be clearly adjusted at the same time, and in the center of the field of view, it is clear
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